208389 ⎘
Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor; Types of semiconductor device ; Multistep manufacturing processes therefor; Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices Resistors with PN junction
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#2SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD
#3SEMICONDUCTOR DEVICE AND METHOD
#4RESISTOR STRUCTURE INCLUDING CHARGE CONTROL LAYER
#5SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD
#6Dielectric and isolation lower fin material for fin-based electronics
#7Bandgap reference circuit including vertically stacked active SOI devices
#8Dielectric and isolation lower fin material for fin-based electronics
#9FinFET based capacitors and resistors and related apparatuses, systems, and methods
#10Resistor element
#11Metal-oxide-polysilicon tunable resistor for flexible circuit design and method of fabricating same
#12Electronic device and circuit including a transistor and a variable resistor
#13Dielectric and isolation lower Fin material for Fin-based electronics
#14High voltage resistor device
#15Dielectric and isolation lower Fin material for Fin-based electronics
#16Fin-type resistor
#17Solid-source diffused junction for fin-based electronics
#18Compact self-aligned implantation transistor edge resistor for SRAM SEU mitigation
#19Integrated fabrication of semiconductor devices
#20Methods to improve the performance of compound semiconductor devices and field effect transistors
#21Junction-less insulated gate current limiter device
#22Methods and apparatus for bipolar junction transistors and resistors
#23Variable capacitance devices
#24Variable resistance device having parallel structure
#25Diffusion resistor with reduced voltage coefficient of resistance and increased breakdown voltage using CMOS wells
#26Diffusion resistor with reduced voltage coefficient of resistance and increased breakdown voltage using CMOS wells
#27High voltage resistor
#28Methods and apparatus for bipolar junction transistors and resistors
#29Method of manufacturing a nanostructure quick-switch memristor
#30High voltage resistor
#31Nanostructure quick-switch memristor and method of manufacturing the same
#32Fabrication method of two-terminal semiconductor component using trench technology
#33Semiconductor devices with improved local matching and end resistance of RX based resistors
#34Method for fabricating device structures having a variation in electrical conductivity
#35DISCRETE ON-CHIP SOI RESISTORS
#36TRIDIMENSIONAL INTEGRATED RESISTOR
#37Voltage-controlled semiconductor structure, resistor, and manufacturing processes thereof
#38Semiconductor resistor, method of manufacturing the same, and current generating device using the same
#39Method for fabricating a semiconductor structure having selective dopant regions
#40Discrete on-chip SOI resistors
#41Method for modifying the impedance of semiconductor devices using a focused heating source
#42Fin-type resistor