208481 ⎘
Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor; Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched; Unipolar devices, e.g. field effect transistors; Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
Semiconductor device and method for fabricating the same
#302Electro-optical device and electronic apparatus
#303Profile design for improved device performance
#304SPACER AND CHANNEL LAYER OF THIN-FILM TRANSISTORS
#305Semiconductor device and method for forming the same
#306Extension region for a semiconductor device
#307Semiconductor device for radio frequency switch, radio frequency switch, and radio frequency module
#308Method and related apparatus for reducing gate-induced drain leakage in semiconductor devices
#309Semiconductor device
#310Etching platinum-containing thin film using protective cap layer
#311Gate electrodes with notches and methods for forming the same
#312Prevention of extension narrowing in nanosheet field effect transistors
#313Methods for forming contact plugs with reduced corrosion
#314Method for manufacturing insulated gate field effect transistor
#315Display driver semiconductor device and manufacturing method thereof
#316Gate spacer and method of forming
#317Transistor layout to reduce kink effect
#318Contact plug without seam hole and methods of forming the same
#319BIAS SCHEME FOR WORD PROGRAMMING IN NON-VOLATILE MEMORY AND INHIBIT DISTURB REDUCTION
#320Optical sensor and signal readout method therefor, and solid-state image pickup device and signal readout method therefor
#321Method for manufacturing semiconductor device
#322Seal method to integrate non-volatile memory (NVM) into logic or bipolar CMOS DMOS (BCD) technology
#323Semiconductor structure and manufacturing method of the same
#324Semiconductor device and manufacturing method therefor
#325Semiconductor device having modified profile metal gate
#326SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
#327Method for increasing germanium concentration of FIN and resulting semiconductor device
#328SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
#329Gate spacer and methods of forming
#330Raised epitaxial LDD in MuGFETs and methods for forming the same
#331MOSFET Having Drain Region Formed Between Two Gate Electrodes with Body Contact Region and Source Region Formed in a Double Well Region
#332Seal method to integrate non-volatile memory (NVM) into logic or bipolar CMOS DMOS (BCD) technology
#333Method and related apparatus for reducing gate-induced drain leakage in semiconductor devices
#334Polysilicon design for replacement gate technology
#335Semiconductor device
#336Transistor layout to reduce kink effect
#337Mitigation of hot carrier damage in field-effect transistors
#338Stacked nanosheets with self-aligned inner spacers and metallic source/drain
#339Transistor with contacted deep well region
#340Method and related apparatus for reducing gate-induced drain leakage in semiconductor devices
#341Method for manufacturing finFET structure with doped region
#342Fabricating method of oxide layer within peripheral circuit region
#343SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#344Semiconductor device and method for fabricating the same
#345Contact resistance reduction employing germanium overlayer pre-contact metalization
#346Semiconductor method for manufacturing a device including silicides of different composition concentrations on the gate electrode and diffusion regions
#347Semiconductor device for radio frequency switch, radio frequency switch, and radio frequency module
#348Semiconductor device
#349SEMICONDUCTOR STRUCTURE WITH METAL GATE, AND METHOD FOR MANUFACTURING THE SAME
#350Method of Forming High-Voltage Transistor with Thin Gate Poly
#351Metal-oxide-semiconductor field-effect-transistors (MOSFET) as antifuse elements
#352Two step fin etch and reveal for VTFETs and high breakdown LDVTFETs
#353Semiconductor device gate spacer structures and methods thereof
#354Method for FinFET LDD doping
#355Semiconductor device and method of fabricating the same
#356Fully-depleted CMOS transistors with u-shaped channel
#357Semiconductor device having interfacial layer and high K dielectric layer
#358Isolated laterally diffused metal oxide semiconductor (LDMOS) transistor having low drain to body capacitance
#359Selective germanium P-contact metalization through trench
#360Semiconductor device and method for manufacturing semiconductor device
#361RF switch on high resistive substrate
#362PROCESS FOR FORMING A LAYER OF A WORK FUNCTION METAL FOR A MOSFET GATE HAVING A UNIAXIAL GRAIN ORIENTATION
#363Reduced capacitance coupling effects in devices
#364Channel strain inducing architecture and doping technique at replacement poly gate (RPG) stage
#365Metal-insensitive epitaxy formation
#366MOSFETs with multiple dislocation planes
#367Source ballasting for p-channel trench MOSFET
#368FinFET device
#369Power semiconductor devices
#370Method for FinFET LDD doping
#371Selective polysilicon doping for gate induced drain leakage improvement
#372Semiconductor device and method for fabricating semiconductor device
#373Semiconductor device and manufacturing method thereof
#374P-type field effect transistor and method for fabricating the same
#375Semiconductor device having curved gate electrode aligned with curved side-wall insulating film and stress-introducing layer between channel region and source and drain regions
#376Method of manufacturing MOS transistor spacers
#377Integrated circuit devices
#378Post contact air gap formation
#379Method of fabricating semiconductor devices with same conductive type but different threshold voltages
#380SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
#381Method for making CMOS image sensor including stacked semiconductor chips and readout circuitry including a superlattice
#382Method for manufacturing a metal gate
#383Semiconductor device and a method of manufacturing the same
#384Method for manufacturing FinFET structure with doped region
#385MOSFET with selective dopant deactivation underneath gate
#386Circuit structure and method for reducing electronic noises
#387Method of forming transistor with dual spacer
#388Semiconductor device gate spacer structures and methods thereof
#389Transistor with dual spacer and forming method thereof
#390Semiconductor device and method of manufacturing the same
#391Transistor layout to reduce kink effect
#392Bias scheme for word programming in non-volatile memory and inhibit disturb reduction
#393Semiconductor device, related manufacturing method, and related electronic device
#394Semiconductor device, CMOS circuit, and electronic apparatus with stress in channel region
#395Integrated circuit metal gate structure
#396Semiconductor device and method for manufacturing the same
#397Semiconductor device including an epitaxy region
#398Silicide block isolation for reducing off-capacitance of a radio frequency (RF) switch
#399MOS devices with non-uniform p-type impurity profile
#400Semiconductor structure and manufacturing method of the same
#401Reduced capacitance coupling effects in devices
#402Methods for forming contact plugs with reduced corrosion
#403Semiconductor device and manufacturing method thereof
#404Semiconductor device and method
#405Dual gate metal-oxide-semiconductor field-effect transistor
#406FinFET device and method of forming same
#407SIDEWALL ENGINEERING FOR ENHANCED DEVICE PERFORMANCE IN ADVANCED DEVICES
#408Reducing series resistance between source and/or drain regions and a channel region
#409Reducing series resistance between source and/or drain regions and a channel region
#410Imaging apparatus, method of manufacturing the same, and device
#411Semiconductor device and manufacturing method thereof
#412Low voltage difference operated EEPROM and operating method thereof
#413CONTACT TO SOURCE/DRAIN REGIONS AND METHOD OF FORMING SAME
#414Thin film transistor, method of manufacturing the same, and display apparatus including the thin film transistor
#415High voltage galvanic isolation device
#416FinFET device and methods of forming
#417Fin structures having varied fin heights for semiconductor device
#418Fin structures having varied fin heights for semiconductor device
#419Device to decrease flicker noise in conductor-insulator-semiconductor (CIS) devices
#420Multi-layer semiconductor element, semiconductor device, and electronic device for storage, and method of manufacturing the same
#421Semiconductor devices
#422Method for making a semiconductor device including non-monocrystalline stringer adjacent a superlattice-sti interface
#423Superlattice materials and applications
#424Semiconductor device and manufacturing method of the same
#425Polysilicon design for replacement gate technology
#426Semiconductor device, manufacturing method of the same, solid-state imaging device, and electronic device
#427Semiconductor device and method for forming the same
#428Seal method to integrate non-volatile memory (NVM) into logic or bipolar CMOS DMOS (BCD) technology
#429Semiconductor device for display driver IC structure
#430MOS transistor with reduced hump effect
#431Method of forming high-voltage transistor with thin gate poly
#432Semiconductor devices comprising nitrogen-doped gate dielectric, and methods of forming semiconductor devices
#433Method of manufacturing semiconductor device comprising doped gate spacer
#434Semiconductor switch device and method having at least two contacts located on either the source region or the drain region
#435Semiconductor device and manufacturing method thereof
#436Semiconductor memory device and conductive structure
#437Gate structure, semiconductor device and the method of forming semiconductor device
#438Semiconductor device having interfacial layer and high κ dielectric layer
#439Semiconductor device and a method for fabricating the same
#440Oxide-nitride-oxide stack having multiple oxynitride layers
#441Oxide-nitride-oxide stack having multiple oxynitride layers
#442SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#443Semiconductor structure and fabrication method thereof
#444Method for making DRAM with recessed channel array transistor (RCAT) including a superlattice
#445Semiconductor device in a level shifter with electrostatic discharge (ESD) protection circuit and semiconductor chip
#446Method for fabricating a semiconductor device
#447Contact silicide having a non-angular profile
#448Transistor devices having source/drain structure configured with high germanium content portion
#449Method of manufacturing semiconductor device
#450Electrostatic discharge (ESD) protection device and method for operating an ESD protection device
#451High power RF switches using multiple optimized transistors and methods for fabricating same
#452Method of manufacturing a semiconductor device
#453Semiconductor device and method of manufacturing the same
#454Prevention of extension narrowing in nanosheet field effect transistors
#455Prevention of extension narrowing in nanosheet field effect transistors
#456EMBEDDED SIGE PROCESS FOR MULTI-THRESHOLD PMOS TRANSISTORS
#457Trench isolated IC with transistors having LOCOS gate dielectric
#458Backside substrate openings in transistor devices
#459Conductive structures in semiconductor devices
#460High voltage PMOS (HVPMOS) transistor with a composite drift region and manufacture method thereof
#461Semiconductor device and method for manufacturing the same
#462Semiconductor device and manufacturing method thereof
#463SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE
#464Laterally diffused metal-oxide semiconductor field-effect transistor
#465Semiconductor device and method of manufacturing the same
#466Source/drain profile for FinFeT
#467SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
#468Method for manufacturing insulated gate field effect transistor
#469Field-effect transistors with a T-shaped gate electrode
#470Method for fabricating semiconductor device
#471Semiconductor device
#472Semiconductor device having a dielectric layer with different thicknesses and method for forming
#473High voltage field effect transistor with laterally extended gate dielectric and method of making thereof
#474Contact plug without seam hole and methods of forming the same
#475Transistor, protection circuit, and method of manufacturing transistor
#476Cascode amplifier optimization
#477Semiconductor devices with low junction capacitances and methods of fabrication thereof
#478Raised epitaxial LDD in MuGFETs and methods for forming the same
#479Tipless transistors, short-tip transistors, and methods and circuits therefor
#480Semiconductor device and method of fabricating the same
#481Method of manufacturing a MISFET on an SOI substrate
#482Polysilicon design for replacement gate technology
#483Method for fabricating semiconductor structure
#484Semiconductor device including quantum wires
#485Semiconductor device having multiple wells
#486Etching platinum-containing thin film using protective cap layer
#487P-channel DEMOS device
#488Semiconductor device structure useful for bulk transistor and method of manufacturing same
#489Semiconductor device and method of manufacturing same
#490Semiconductor device having curved gate electrode aligned with curved side-wall insulating film and stress-introducing layer between channel region and source and drain regions
#491Semiconductor device having asymmetric spacer structures
#492Metal oxide semiconductor device having mitigated threshold voltage roll-off and threshold voltage roll-off mitigation method thereof
#493Semiconductor devices
#494Gate electrodes with notches and methods for forming the same
#495Semiconductor device and method for manufacturing the same
#496Semiconductor device and fabrication method thereof
#497Semiconductor epitaxy bordering isolation structure
#498Vertical power MOSFET and methods for forming the same
#499Semiconductor device
#500N-type fin field-effect transistor
#501Unit pixel for image sensor comprising contact pad connected to light receiving portion
#502Methods for titanium silicide formation using TiClprecursor and silicon-containing precursor
#503Metal gate structure and manufacturing method thereof
#504Tunneling field effect transistor
#505Method for manufacturing embedded non-volatile memory
#506Mechanisms for growing epitaxy structure of finFET device
#507finFET device and methods of forming
#508FinFET device and methods of forming
#509Superlattice materials and applications
#510Semiconductor structure and planarization method thereof
#511FinFET device and method of forming
#512Semiconductor device and manufacturing method therefor
#513Deposition apparatus and method for manufacturing semiconductor device using the same
#514Semiconductor device and method of manufacturing the same
#515Conductive layout structure including high resistive layer
#516Field effect transistor device with separate source and body contacts and method of producing the device
#517Fin field-effect transistor and fabrication method thereof
#518One-time programmable bitcell with native anti-fuse
#519Low temperature poly-silicon thin film transistor and method for manufacturing the same
#520Asymmetric dense floating gate nonvolatile memory with decoupled capacitor
#521FinFET device and fabrication method thereof
#522Fin-FET devices and fabrication methods thereof
#523MOSFETs with multiple dislocation planes
#524Reliable non-volatile memory device
#525Fully-depleted CMOS transistors with U-shaped channel
#526Embedded memory with enhanced channel stop implants
#527Switching field plate power MOSFET
#528Integrated LDMOS and VFET transistors
#529FET device manufacturing using a modified Ion implantation method
#530Display driver semiconductor device and manufacturing method thereof
#531MULTI-TIME PROGRAMMABLE (MTP) MEMORY CELLS, INTEGRATED CIRCUITS INCLUDING THE SAME, AND METHODS FOR FABRICATING THE SAME
#532Heterogeneous source drain region and extension region
#533Purging deposition tools to reduce oxygen and moisture in wafers
#534Semiconductor switch device
#535Semiconductor structure and method for fabricating the same
#536Extension region for a semiconductor device
#537Integrated circuits having source/drain structure
#538Power transistor having perpendicularly-arranged field plates and method of manufacturing the same
#539Transistor with contacted deep well region
#540Display driver semiconductor device and manufacturing method thereof
#541Nonvolatile memory having a shallow junction diffusion region
#542Surface devices within a vertical power device
#543Device and system of a silicon controlled rectifier (SCR)
#544Semiconductor structure
#545Selective germanium p-contact metalization through trench
#546Method of manufacturing semiconductor device
#547Semiconductor device having a metal gate electrode stack
#548SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE
#549Fringe capacitance reduction for replacement gate CMOS
#550High gain transistor for analog applications
#551Semiconductor device and manufacturing method therefor
#552I-shaped gate electrode for improved sub-threshold MOSFET performance
#553Integrated circuits and methods of design and manufacture thereof
#554Method of forming semiconductor device with gate
#555Semiconductor structure and manufacturing method thereof
#556Semiconductor device and a method of manufacturing the same
#557Semiconductor device and method for fabricating the same
#558Method of fabricating semiconductor device isolation structure
#559Buried channel deeply depleted channel transistor
#560Manufacturing method of semiconductor device including transistor having offset insulating layers
#561Contact for high-k metal gate device
#562Method for manufacturing semiconductor device, ion beam etching device, and control device
#563Methods to enhance effective work function of mid-gap metal by incorporating oxygen and hydrogen at a low thermal budget
#564Isolated well contact in semiconductor devices
#565Semiconductor device with silicon layer containing carbon
#566Erasable programmable non-volatile memory
#567High voltage CMOS with triple gate oxide
#568Semiconductor apparatus with fake functionality
#569Random number generator device and control method thereof
#570Integrated circuit devices and methods
#571Method of manufacturing a MOSFET on an SOI substrate
#572Method of forming epitaxial buffer layer for finFET source and drain junction leakage reduction
#573Semiconductor device in a level shifter with electrostatic discharge (ESD) protection circuit and semiconductor chip
#574KITE SHAPED CAVITY FOR EMBEDDING MATERIAL
#575Silicon on nothing devices and methods of formation thereof
#576Polysilicon design for replacement gate technology
#577Method of fabricating a semiconductor device having modified profile metal gate
#578Semiconductor device including storage element
#579Low-cost semiconductor device manufacturing method
#580High voltage galvanic isolation device
#581Semiconductor device and manufacturing method of semiconductor device
#582Method for manufacturing semiconductor element and method for forming mask pattern of the same
#583Semiconductor device and a method of manufacturing a semiconductor device
#584Method of manufacturing semiconductor integrated circuit device
#585SOI integrated circuit equipped with a device for protecting against electrostatic discharges
#586Fin field effect transistor and method for fabricating the same
#587Semiconductor integrated circuit apparatus and manufacturing method for same
#588Doping profile for strained source/drain region
#589Method of fabricating a transistor with reduced hot carrier injection effects
#590Method for parameter extraction of a semiconductor device
#591Semiconductor device and method of manufacturing the same
#592Doped protection layer for contact formation
#593RF switch on high resistive substrate
#594Methods of fabricating semiconductor devices
#595Memory cell and fabrication method thereof
#596Semiconductor device having asymmetric active region and method of forming the same
#597Transistor with quantum point contact
#598Transistor with source-drain silicide pullback
#599Semiconductor device and method of fabricating the same
#600Semiconductor devices including a stressor in a recess and methods of forming the same