209066 ⎘
Solid state devices adapted for rectifying, amplifying, oscillating or switching without a potential-jump barrier or surface barrier, e.g. dielectric triodes; Ovshinsky-effect devices; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Bistable or multistable switching devices, e.g. for resistance switching non-volatile memory; Selection of switching materials; Compounds of sulfur, selenium or tellurium, e.g. chalcogenides Tellurides, e.g. GeSbTe
PHASE-CHANGE MEMORY CELL WITH MIXED-MATERIAL SWITCHABLE REGION
#2Boron Surface Passivation of Phase Change Memory Material
#3Hydrogen and Hydrocarbon Plasma Treatment of Phase Change Memory Material
#4MEMORY DEVICE AND METHOD OF MAKING THE SAME
#5MEMORY CELL, INTEGRATED CIRCUIT, AND MANUFACTURING METHOD OF MEMORY CELL
#6Multi-bit storage device using phase change material
#7MEMORY DEVICE AND FABRICATION METHOD THEREOF
#8VERTICAL ULTRA-THIN PCM CELL
#9VERTICAL PHASE CHANGE SWITCH DEVICES AND METHODS
#10RADIO FREQUENCY SWITCH FOR MULTI-BAND FILTER APPLICATIONS AND METHODS FOR FORMING THE SAME
#11PHASE-CHANGE MATERIAL (PCM) RADIO FREQUENCY (RF) SWITCHING DEVICE WITH AIR GAP
#12PHASE-CHANGE MATERIAL (PCM) RADIO FREQUENCY (RF) SWITCHING DEVICE WITH THIN SELF-ALIGNED DIELECTRIC LAYER
#13PHASE-CHANGE RANDOM ACCESS MEMORY DEVICE AND METHOD OF FORMING THE SAME
#14Phase change material switch with improved thermal confinement and methods for forming the same
#15SEMICONDUCTOR MEMORY DEVICE INCLUDING CHALCOGENIDE
#16SiC-Doped Ge1Sb2Te4 Phase-Change Materials for 3D Crosspoint Memory
#17SEMICONDUCTOR STORAGE DEVICE
#18Phase change memory with multi-level programming
#19PHASE-CHANGE MEMORY CELL WITH REDUCED HEATER SIZE
#20PHASE CHANGE MEMORY WITH REDUCED PROGRAMMING CURRENT
#21Variable resistance non-volatile memory with a gate insulator film at a same height as a voltage application electrode
#22CONFINED PHASE-CHANGE MEMORY CELL WITH SELF-ALIGNED ELECTRODE AND REDUCED THERMAL LOSS
#23In-situ formation of a spacer layer for protecting sidewalls of a phase change memory element and methods for forming the same
#24Memory device, method for configuring memory cell in N-bit memory unit, and memory array
#25Method of making ovonic threshold switch selectors using microwave annealing
#26Ovonic threshold switch selectors with electrodes including carbon and metal
#27BRIDGE CELL PHASE CHANGE MEMORY
#28PCM cell with nanoheater surrounded with airgaps
#29ELECTRODE RECESSED PHASE CHANGE MEMORY PORE CELL
#30MULTI-LEVEL PROGRAMMING OF PHASE CHANGE MEMORY DEVICE
#31Programming Current Control for Artificial Intelligence (AI) Devices
#32Phase change memory device with improved retention characteristics and related method
#33SEMICONDUCTOR DEVICES
#34Reducing contact resistance of phase change memory bridge cell
#35MEMORY COMPRISING CONDUCTIVE FERROELECTRIC MATERIAL IN SERIES WITH DIELECTRIC MATERIAL
#36Phase change memory with encapsulated phase change element
#37Memory cells, memory cell arrays, methods of using and methods of making
#38ARTIFICIAL INTELLIGENCE (AI) DEVICES WITH IMPROVED THERMAL STABILITY AND SCALING BEHAVIOR
#39Phase change memory device based on nano current channel
#40ARTIFICIAL INTELLIGENCE DEVICE CELL WITH IMPROVED PHASE CHANGE MATERIAL REGION
#41PHASE CHANGE MEMORY WITH IMPROVED RECOVERY FROM ELEMENT SEGREGATION
#42SYNTHESIS AND USE OF PRECURSORS FOR ALD OF GROUP VA ELEMENT CONTAINING THIN FILMS
#43Storage device
#44SEMICONDUCTOR DEVICE AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
#45SEMICONDUCTOR STORAGE DEVICE
#46RESISTANCE CHANGE DEVICE AND STORAGE DEVICE
#47ELECTRICALLY INSULATED PROJECTION LINER FOR AI DEVICE
#48Nonvolatile phase change material logic device
#49Electronic device including channel layer including variable resistance and method of manufacturing the same
#50Three terminal phase change memory with self-aligned contacts
#51Phase change memory with heater
#52Wrap-around projection liner for AI device
#53Via structure and methods of forming the same
#54Phase change memory cell spacer
#55Method to integrate DC and RF phase change switches into high-speed SiGe BiCMOS
#56PCM cell with resistance drift correction
#57SPIKE-TIMING-DEPENDENT PLASTICITY USING INVERSE RESISTIVITY PHASE-CHANGE MATERIAL
#58SYNAPTIC DEVICE, RESERVOIR COMPUTING DEVICE INCLUDING THE SYNAPTIC DEVICE, AND RESERVOIR COMPUTING METHOD USING THE COMPUTING DEVICE
#59EMBEDDED DOUBLE SIDE HEATING PHASE CHANGE RANDOM ACCESS MEMORY (PCRAM) DEVICE AND METHOD OF MAKING SAME
#60MEMORY DEVICE AND ELECTRONIC APPARATUS INCLUDING THE SAME
#61Selector and memory device using the same
#62RECONFIGURABLE MEMTRANSISTORS, FABRICATING METHODS AND APPLICATIONS OF SAME
#63Phase change memory with conductive rings
#64MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
#65TUNABLE INDUCTOR DEVICE
#66Phase change memory cell galvanic corrosion prevention
#67Phase change switch with self-aligned heater and RF terminals
#68Novel Nanocomposite Phase-Change Memory Materials and Design and Selection of the Same
#69ELECTRONIC SYNAPSE DEVICE AND METHOD OF FORMING THE SAME
#70Phase change memory cell with an airgap to allow for the expansion and restriction of the PCM material
#71Storage device
#72Memory device
#73Semiconductor storage device
#74RECONFIGURABLE TRANSISTOR DEVICE
#75METHODS OF FORMING ELECTRONIC DEVICES COMPRISING METAL OXIDE MATERIALS
#76MEMORY DEVICE WITH MEMORY STRINGS USING VARIABLE RESISTANCE MEMORY REGIONS
#77Phase-change memory device and method
#78PCRAM STRUCTURE
#79With low density change, phase-change memory and preparation method therefor
#80MULTIPLE MEMORY STATES DEVICE AND METHOD OF MAKING SAME
#81PHASE CHANGE MATERIAL, PHASE CHANGE MEMORY CELL AND PREPARATION METHOD THEREFOR
#82Nonvolatile tunable capacitive processing unit
#83Storage device having a resistance change memory element and writing method thereof
#84Reversible resistive memory logic gate device
#85Resistance change device and storage device
#86Memory device
#87Selector device and semiconductor storage device
#88Three-dimensional memory arrays, and methods of forming the same
#89Stack of horizontally extending and vertically overlapping features, methods of forming circuitry components, and methods of forming an array of memory cells
#90STORAGE DEVICE AND STORAGE UNIT
#91Phase-change random access memory device and method of making the same
#92Memory devices and methods of forming the same
#93ELECTRONIC DEVICE WITH VARIABLE RESISTANCE LAYERS AND INSULATING LAYERS ALTERNATELY STACKED AND METHOD OF MANUFACTURING THE SAME
#94RESISTIVE MEMORY ARCHITECTURES WITH MULTIPLE MEMORY CELLS PER ACCESS DEVICE
#95Three-dimensional stacked phase change memory and preparation method thereof
#96Memory devices with selector layer and methods of forming the same
#97SELECTOR DEVICES
#98Memory cell, method of forming the same, and semiconductor device having the same
#99MEMORY DEVICE WITH INCREASED ELECTRODE RESISTANCE TO REDUCE TRANSIENT SELECTION CURRENT
#100Memory devices and methods of forming the same
#101Semiconductor memory device with a phase change layer and particular heater material
#102MEMORY SELECTOR
#103Phase change memory and method for making the same
#104Mitigating moisture driven degradation of silicon doped chalcogenides
#105Phase change memory device having tapered portion of the bottom memory layer
#106Transfer length phase change material (PCM) based bridge cell
#107Semiconductor memory having both volatile and non-volatile functionality including resistance change material and method of operating
#108PCRAM analog programming by a gradual reset cooling step
#109Sputtering target including carbon-doped GST and method for fabricating electronic device using the same
#110Memory device and method of manufacturing the same
#111Electrically formed memory array using single element materials
#112Semiconductor apparatus including a phase change material layer having a first and a second chalcogen layer
#113Resistance drift mitigation in non-volatile memory cell
#114Integrated diode memory device
#115Programming enhancement in self-selecting memory
#116Arrays of memory cells and methods of forming an array of vertically stacked tiers of memory cells
#117Uniform voltage drop in arrays of memory devices
#118Memory cell and semiconductor device having the same
#119Semiconductor device having three-dimensional cell structure
#120Fill-in confined cell PCM devices
#121Phase change random access memory device
#122Semiconductor device including layers with different chalcogen compounds and semiconductor apparatus including the same
#123Memory device having a ring heater
#124LOW-POWER PHASE-CHANGE MEMORY TECHNOLOGY WITH INTERFACIAL THERMOELECTRIC HEATING ENHANCEMENT
#125Memory device
#126Phase change memory using multiple phase change layers and multiple heat conductors
#127SYSTEMS, DEVICES, AND METHODS FOR DEPOSITING A LAYER COMPRISING A GERMANIUM CHALCOGENIDE
#128Electronic synaptic device and method for manufacturing same
#129Projected memory device with carbon-based projection component
#130Multitier arrangements of integrated devices, and methods of protecting memory cells during polishing
#131Semiconductor memory having both volatile and non-volatile functionality comprising resistive change material and method of operating
#132Display material
#133Semiconductor device including data storage material pattern
#134Nonvolatile memory device
#135Interconnection for memory electrodes
#136Memory device and method of manufacturing the same
#137Memory cells with asymmetrical electrode interfaces
#138Semiconductor memory device with selection patterns, storage patterns, and a gap fill layer and method for fabricating the same
#139Projected memory device with carbon-based projection component
#140Semiconductor storage device
#141Three-dimensional resistive random access memory and method making it possible to obtain such a memory
#142Phase-change memory device having reversed phase-change characteristics and phase-change memory having highly integrated three-dimensional architecture using same
#143Electronic component manufacturing method
#144PHASE-CHANGE MATERIAL AND ASSOCIATED RESISTIVE PHASE-CHANGE MEMORY
#145Semiconductor memory device
#146Variable resistance memory device
#147Transition metal dichalcogenide (TMD) layer stack for transistor applications and methods of fabrication
#148Insulation of phase-change memory cells
#149Three-dimensional memory array
#150Memory device and method of manufacturing memory device
#151Van der Waals heterostructure memory device and switching method
#152Semiconductor material for resistive random access memory
#153Memory device
#154Switch device and method for manufacturing a switch device
#155Memory devices with selector layer and methods of forming the same
#156Phase change memory with conductive bridge filament
#157METHOD OF FORMING CHALCOGENIDE-BASED THIN FILM USING ATOMIC LAYER DEPOSITION PROCESS, METHOD OF FORMING PHASE CHANGE MATERIAL LAYER AND SWITCHING DEVICE, AND METHOD OF FABRICATING MEMORY DEVICE USING THE SAME
#158Semiconductor memory and method of manufacturing the same
#159Sense lines in three-dimensional memory arrays, and methods of forming the same
#160Synthesis and use of precursors for ALD of tellurium and selenium thin films
#161Phase-change memory device and method
#162Low resistance multi-layer electrode for phase change memory and methods of making the same
#163Memory cell, method of forming the same, and semiconductor device having the same
#164Semiconductor device, memory cell and method of forming the same
#165Phase change memory structure and manufacturing method for the same
#166Non-volatile memory
#167High thermal stability SiOdoped GeSbTe materials suitable for embedded PCM application
#168Projected phase change memory devices
#169Electronic chip with two phase change memories
#170DIELECTRIC BARRIER AT NON-VOLATILE MEMORY TILE EDGE
#171Phase change material switch and method of fabricating same
#172Memory device with a plurality of metal chalcogenide layers
#173Systems and methods for phase change material based thermal assessment
#174Selector and non-volatile storage device
#175Suppressing oxidation of silicon germanium selenium arsenide material
#176Threshold switching selector based memory
#177Phase-change memory cell having a compact structure
#178Three-dimensional memory array
#179Integrated Memory Having Non-Ohmic Devices and Capacitors
#180VIA structure and methods of forming the same
#181Phase change memory using multiple stacks of PCM materials
#182Semiconductor memory device with resistance change memory element and manufacturing method of semiconductor memory device with resistance change memory element
#183Integrated reactive material erasure element with phase change memory
#184Three dimensional memory arrays
#185Memory cells, memory cell arrays, methods of using and methods of making
#186Selection element with a plurality of amorphous layers
#187Memory devices and methods of forming the same
#188Phase-change memory cell
#189Phase-change random access memory device with doped Ge—Sb—Te layers and method of making the same
#190Semiconductor memory device including phase change material layers and method for manufacturing thereof
#191PCM cell with resistance drift correction
#192Memory device having a ring heater
#193Memory including a selector switch on a variable resistance memory cell
#194STACKED STRUCTURE AND METHOD OF MANUFACTURING SAME, AND SEMICONDUCTOR DEVICE
#195Resistance variable device with chalcogen-containing layer
#196Nonvolatile memory device having a resistance change layer and a plurality of electrode pattern layers
#197Three-dimensional nonvolatile memory device having resistance change structure and method of operating the same
#198Electronic device and method of manufacturing the same
#199Variable resistance memory device
#200PHASE CHANGE MEMORY CELL WITH CONSTRICTION STRUCTURE
#201Memory device and method of manufacturing the same
#202Integrated memory having non-ohmic devices and capacitors
#203Phase-change memory with no drift
#204Variable resistance memory devices
#205Three dimensional memory arrays
#206Memory for embedded applications
#207Variable resistance memory devices implementing two-dimensional transition metal dichalcogenide materials
#208Multitier arrangements of integrated devices, and methods of forming sense/access lines
#209Synthesis and use of precursors for ALD of group VA element containing thin films
#210Methods of manufacturing semiconductor devices
#211Tapered memory cell profiles
#212Memory device with increased electrode resistance to reduce transient selection current
#213Semiconductor device and method of forming the same
#214Material implication operations in memory
#215Phase change material with reduced reset state resistance drift
#216Phase change memory device
#217Memory devices
#218Tapered cell profile and fabrication
#219PCRAM analog programming by a gradual reset cooling step
#220Memory device and operating method thereof
#221Semiconductor memory having both volatile and non-volatile functionality including resistance change material and method of operating
#222Method of fabricating a variable resistance memory device
#223Electronic device and operating method of electronic device
#224Electronic device
#225Cross-point memory and methods for fabrication of same
#226SEMICONDUCTOR STORAGE DEVICE
#227Variable resistance element
#228Phase change memory device having tapered portion of the bottom memory layer
#229Semiconductor memory having both volatile and non-volatile functionality comprising resistive change material and method of operating
#230Semiconductor memory device
#231Method to integrate DC and RF phase change switches into high-speed SiGe BiCMOS
#232Method of fabricating semiconductor devices using a two-step gap-fill process
#233Method for manufacturing a semiconductor device including a low-k dielectric material layer
#234Phase change memory with conductive bridge filament
#235Resistance variable memory device including stacked memory cells
#236Semiconductor device including a data storage material pattern
#237Resistive random access memory and manufacturing method thereof
#238Fabrication of phase change memory cell in integrated circuit
#239Memory device and method of manufacturing the same
#240Resistive memory architectures with multiple memory cells per access device
#241Dielectric barrier at non-volatile memory tile edge
#242System on chip (Soc) based on neural processor or microprocessor
#243System on chip (SoC) based on neural processor or microprocessor
#244Memory device and a method for forming the memory device
#245Multi-level phase change memory cells and method of making the same
#246Semiconductor device having buried gate structure and method for fabricating the same
#247Phase change memory (PCM) with gradual reset characteristics
#248Method for manufacturing semiconductor device
#249MEMORY DEVICE
#250Memory cell and memory device comprising selection device layer, middle electrode layer and variable resistance layer
#251Phase change memory using multiple phase change layers and multiple heat conductors
#252Memory device containing ovonic threshold switch material thermal isolation and method of making the same
#253Single-sided liner PCM cell for 3D crossbar PCM memory
#254Fabrication of stackable embedded eDRAM using a binary alloy based on antimony
#255Phase change memory device with crystallization template and method of making the same
#256Multi-level loop cut process for a three-dimensional memory device using pitch-doubled metal lines
#257SEMICONDUCTOR DEVICE
#258Memory cell
#259Nonvolatile memory device
#260Non-volatile memory element arrays in a wheatstone bridge arrangement
#261Method for driving an electronic device including a semiconductor memory in a test mode
#262Method for forming a phase change memory (PCM) cell with a low deviation contact area between a heater and a phase change element
#263Phase change memory and method of fabricating the same
#264Nonvolatile memory device
#265Drift mitigation with embedded refresh
#266Method for manufacturing a phase change memory device having a second opening above a first opening in the dielectric layer
#267Three-dimensional memory apparatuses and methods of use
#268Electronic device and method for fabricating electronic device
#269Three-dimensional cross-point memory device containing inter-level connection structures and method of making the same
#270Multitier arrangements of integrated devices, and methods of protecting memory cells during polishing
#2713D phase change memory
#272Storage device and storage unit with a chalcogen element
#273Methods for forming narrow vertical pillars and integrated circuit devices having the same
#274Multitier arrangements of integrated devices, and methods of forming sense/access lines
#275Electronic device
#276Connections for memory electrode lines
#277Semiconductor memory device including variable resistance layer
#278Memory cells, memory cell arrays, methods of using and methods of making
#279Memory arrays
#280Power handling improvements for phase-change material (PCM) radio frequency (RF) switch circuits
#281Transition metal doped germanium-antimony tellurium (GST) memory device components and composition
#282RRAM cell structure with laterally offset BEVA/TEVA
#283Semiconductor devices
#284Vertically oriented memory structure
#285Phase change memory
#286Resistance variable memory device including stacked memory cells
#287Chalcogenide memory device components and composition
#288Memory cells with asymmetrical electrode interfaces
#289Resistive memory device and method of manufacturing the resistive memory device
#290Semiconductor memory device
#291Memory structures having improved write endurance
#292Tapered cell profile and fabrication
#293MEMORY DEVICE AND METHOD OF FORMING THE SAME
#294Phase change memory and method of fabricating the same
#295Memory device
#296Three-dimensional memory array
#297Memory cells having resistors and formation of the same
#298Methods of forming a phase change memory with vertical cross-point structure
#299Memory device
#300Semiconductor memory device