233427 ⎘
Generating plasma; Handling plasma; Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature using electromagnetic or particle radiation, e.g. interferometry by spectrometry
Multiple Plasma Ion Source for Inline Secondary Ion Mass Spectrometry
#2SYSTEM AND METHOD FOR SPECTROMETRY OF A SAMPLE IN A PLASMA
#3PLASMA TORCH DEVICE COMPONENT MONITORING
#4MULTIPLE PLASMA ION SOURCE FOR INLINE SECONDARY ION MASS SPECTROMETRY
#5Spark stand and method of maintenance
#6Systems and methods for Thomson scattering background interference suppression
#7Process control for atmospheric plasma treatment of surfaces
#8Glow plasma gas measurement signal processing
#9Air Leak Detection In Plasma Processing Apparatus With Separation Grid
#10PLASMA MEASURING APPARATUS AND PLASMA MEASURING METHOD
#11Probe for measuring plasma parameters
#12GLOW PLASMA STABILIZATION
#13Air leak detection in plasma processing apparatus with separation grid
#14Water Vapor Quantification Methodology During Drying of Spent Nuclear Fuel
#15Microwave plasma source
#16Laser surface treatment and spectroscopic analysis system
#17Plasma torch
#18Asymmetric induction devices and systems and methods using them
#19Plasma generation apparatus including measurement device and plasma thruster
#20ICP analyzer
#21Apparatus and method for determining the type, density and temperature of neutral radicals in plasma
#22High-frequency power supply device
#23Method and system for analyzing particles in cold plasma
#24Device and use of the device for measuring the density and/or the electron temperature and/or the collision frequency of a plasma
#25Etching apparatus, analysis apparatus, etching treatment method, and etching treatment program
#26Particle density measuring probe and particle density measuring equipment
#27Apparatus and use of the apparatus for the determination of the density of a plasma
#28Arrangement for monitoring thermal spray processes
#29Partial pressure measuring method and partial pressure measuring apparatus
#30System and method for determining at least one constituent in an ambient gas using a microsystem gas sensor
#31Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
#32Systems and methods for lowering the reduction of iron ore energy
#33Counterflow sample introduction and devices, systems and methods using it