243648 ⎘
Nanotechnology; Manufacture, treatment, or detection of nanostructure with scanning probe Scanning probe structure
Sub-classes:Scanning tunneling microscope assembly, reactor, and system
#2Integrated circuits having interconnects and heat dissipators based on nanostructures
#3Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material
#4Apparatus for Direct Fabrication of Nanostructures
#5Methods utilizing scanning probe microscope tips and products thereof or produced thereby
#6Integrated circuits having interconnects and heat dissipators based on nanostructures
#7Aligned nanostructures on a tip
#8Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material
#9Nanometric emitter/receiver guides
#10Nanolithography methods and products therefor and produced thereby
#11Spin-polarized electron source and spin-polarized scanning tunneling microscope
#12Near-field scanning optical microscope probe having a light emitting diode
#13Scanning probe microscope system
#14SPM cantilever and manufacturing method thereof
#15Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly
#16Optical detection alignment/tracking method and apparatus
#17Carbon thin line probe
#18Scanning probe in pulsed-force mode, digital and in real time
#19Integrated circuits having interconnects and heat dissipators based on nanostructures
#20Nanometer scale data storage device and associated positioning system
#21Telegraph signal microscopy device and method
#22Method of fabricating a probe having a field effect transistor channel structure
#23Carbon nanotube with a graphitic outer layer: process and application
#24Scanning probe characterization of surfaces
#25Sensors for electrochemical, electrical or topographical analysis
#26Dynamic activation for an atomic force microscope and method of use thereof
#27Scanning probe microscope and scanning method
#28Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology
#29Probe microscope system suitable for observing sample of long body
#30Conductive transparent probe and probe control apparatus
#31Conductive transparent probe and probe control apparatus
#32Nanolithography methods and products therefor and produced thereby
#33Nanometer scale data storage device and associated positioning system
#34Methods utilizing scanning probe microscope tips and products therefor or produced thereby
#35Methods utilizing scanning probe microscope tips and products thereof or produced thereby
#36Conductive transparent probe and probe control apparatus