243640 ⎘
Nanotechnology; Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property
Sub-classes:Method for characterizing carbon nanotubes by using scanning electron microscope
#2Systems and methods for single-molecule detection using nanopores
#3Apparatus and method for molecular separation, purification, and sensing
#4Systems and methods for single-molecule detection using nanopores
#5Method for positioning carbon nanotubes between electrodes, biomolecule detector based on carbon nanotube-probe complexes and detection method using the same
#6Techniques for electrically characterizing tunnel junction film stacks with little or no processing
#7Techniques for electrically characterizing tunnel junction film stacks with little or no processing
#8Techniques for electrically characterizing tunnel junction film stacks with little or no processing
#9Wafer for electrically characterizing tunnel junction film stacks with little or no processing
#10Proactive detection of metal whiskers in computer systems
#11Hybrid contact mode scanning cantilever system
#12Methods for verifying fluid movement
#13Scanning probe in pulsed-force mode, digital and in real time
#14Scanning probe characterization of surfaces
#15Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope
#16Scanning probe microscope and scanning method
#17Topography and recognition imaging atomic force microscope and method of operation
#18Scanning probe microscope
#19Spatially resolved electromagnetic property measurement
#20Scanning probe microscope and specimen observation method
#21Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces
#22Sensing mode atomic force microscope
#23Dual stage instrument for scanning a specimen
#24Scanning tip orientation adjustment method for atomic force microscopy