243650 ⎘
Nanotechnology; Manufacture, treatment, or detection of nanostructure with scanning probe; Scanning probe structure Near-field probe
Methods of manufacturing semiconductor structures and devices including nanotubes, and semiconductor structures, devices, and systems fabricated using such methods
#2Methods of manufacturing semiconductor structures and devices including nanotubes, and semiconductor structures, devices, and systems fabricated using such methods
#3Tip-enhanced resonant apertures
#4Optical waveguide
#5Probe used for surface enhanced vibrational spectroscopic analysis and method of manufacturing the same
#6Nanolithography methods and products therefor and produced thereby
#7Near-field aperture having a fractal iterate shape
#8Near-field scanning optical microscope probe having a light emitting diode
#9Mirror optic for near-field optical measurements
#10Methods of manufacturing nanotubes having controlled characteristics
#11Method of fabricating a probe having a field effect transistor channel structure
#12Scanning probe characterization of surfaces
#13Recording apparatus
#14Optical element for condensing incident light
#15Probe microscope system suitable for observing sample of long body
#16Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe
#17Near field scanning microscope probe and method for fabricating same
#18Nanolithography methods and products therefor and produced thereby
#19Near-field optical probe
#20Plasmon enhanced near-field optical probes
#21Recording apparatus