ClassID:

243657

Y10S977/869 - CPC Classification

Classification description:

Nanotechnology; Manufacture, treatment, or detection of nanostructure with scanning probe; Scanning probe structure with optical means Optical microscope

Recent Application in this class:
#1
20140127079
2014-05-08

Fluorescent nanoscopy device and method

#2
20120244038
2012-09-27

Scanning tunneling microscope assembly, reactor, and system

#3
20120133740
2012-05-31

Fluorescent nanoscopy method

#4
20110175982
2011-07-21

Fluorescent nanoscopy method

#5
20090045353
2009-02-19

Fluorescent nanoscopy method

#6
20080258073
2008-10-23

Method and apparatus for simultaneously depositing and observing materials on a target

#7
20070100241
2007-05-03

Method and apparatus for viewing through blood

#8
20060289793
2006-12-28

Method and apparatus for simultaneously depositing and observing materials on a target

#9
20060283240
2006-12-21

Method of making a force curve measurement on a sample

#10
20060255818
2006-11-16

Multiple local probe measuring device and method

#11
20060228288
2006-10-12

Carbon nanotube with a graphitic outer layer: process and application

#12
20060213259
2006-09-28

Sensors for electrochemical, electrical or topographical analysis

#13
20060123628
2006-06-15

Method of manufacturing a carbon nanotube device

#14
20060060778
2006-03-23

Probe microscope system suitable for observing sample of long body

#15
20050184746
2005-08-25

Multiple local probe measuring device and method

#16
20050161616
2005-07-28

Method and apparatus for simultaneously depositing and observing materials on a target

#17
20050081610
2005-04-21

Force scanning probe microscope

#18
20050066714
2005-03-31

Active probe for an atomic force microscope and method for use thereof

#19
20050040836
2005-02-24

Multiple local probe measuring device and method

#20
20050029450
2005-02-10

Sensing mode atomic force microscope

#21
20050023462
2005-02-03

Tailoring domain engineered structures in ferroelectric materials