243660 ⎘
Nanotechnology; Manufacture, treatment, or detection of nanostructure with scanning probe; Scanning probe structure Positioner
Scanning probe microscope for cleaning nanostructures
#2Cleaning of nanostructures
#3Scanning probe microscope capable of measuring samples having overhang structure
#4End effector for nano manufacturing
#5Scanning probe microscope capable of measuring samples having overhang structure
#6Scanning probe microscope system
#7Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly
#8Method of making a force curve measurement on a sample
#9Scanning probe microscope and scanning method
#10Flexure assembly for a scanner
#11Alignment-tolerant lens structures for acoustic force actuation of cantilevers
#12MEMS differential actuated nano probe and method for fabrication
#13Fine-adjustment mechanism for scanning probe microscopy
#14MEMS differential actuated nano probe and method for fabrication
#15Force scanning probe microscope
#16Dual stage instrument for scanning a specimen