ClassID:

243663

Y10S977/875 - CPC Classification

Classification description:

Nanotechnology; Manufacture, treatment, or detection of nanostructure with scanning probe; Scanning probe structure with tip detail

Sub-classes:
Recent Application in this class:
#1
20200094295
2020-03-26

Scanning probe microscope for cleaning nanostructures

#2
20180071797
2018-03-15

Cleaning of nanostructures

#3
20120147722
2012-06-14

Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material

#4
20090324450
2009-12-31

Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material

#5
20090218648
2009-09-03

Near-field optical probe based on SOI substrate and fabrication method thereof

#6
20090133171
2009-05-21

Tapered probe structures and fabrication

#7
20080286563
2008-11-20

Probe used for surface enhanced vibrational spectroscopic analysis and method of manufacturing the same

#8
20080160285
2008-07-03

Tip array structure and fabricating method of tip structure

#9
20080061798
2008-03-13

Microcoaxial probes made from strained semiconductor bilayers

#10
20070253314
2007-11-01

Low surface energy coatings in probe recording

#11
20070204681
2007-09-06

Carbon thin line probe

#12
20070128854
2007-06-07

Near-field optical probe based on SOI substrate and fabrication method thereof

#13
20060255818
2006-11-16

Multiple local probe measuring device and method

#14
20060239129
2006-10-26

Nanometer scale data storage device and associated positioning system

#15
20060231754
2006-10-19

Telegraph signal microscopy device and method

#16
20060213259
2006-09-28

Sensors for electrochemical, electrical or topographical analysis

#17
20060060779
2006-03-23

Semiconductor probe with resistive tip and method of fabricating the same

#18
20050190684
2005-09-01

Nanometer scale data storage device and associated positioning system

#19
20050184746
2005-08-25

Multiple local probe measuring device and method

#20
20050066714
2005-03-31

Active probe for an atomic force microscope and method for use thereof

#21
20050040836
2005-02-24

Multiple local probe measuring device and method

#22
20050029450
2005-02-10

Sensing mode atomic force microscope