243663 ⎘
Nanotechnology; Manufacture, treatment, or detection of nanostructure with scanning probe; Scanning probe structure with tip detail
Sub-classes:Scanning probe microscope for cleaning nanostructures
#2Cleaning of nanostructures
#3Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material
#4Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material
#5Near-field optical probe based on SOI substrate and fabrication method thereof
#6Tapered probe structures and fabrication
#7Probe used for surface enhanced vibrational spectroscopic analysis and method of manufacturing the same
#8Tip array structure and fabricating method of tip structure
#9Microcoaxial probes made from strained semiconductor bilayers
#10Low surface energy coatings in probe recording
#11Carbon thin line probe
#12Near-field optical probe based on SOI substrate and fabrication method thereof
#13Multiple local probe measuring device and method
#14Nanometer scale data storage device and associated positioning system
#15Telegraph signal microscopy device and method
#16Sensors for electrochemical, electrical or topographical analysis
#17Semiconductor probe with resistive tip and method of fabricating the same
#18Nanometer scale data storage device and associated positioning system
#19Multiple local probe measuring device and method
#20Active probe for an atomic force microscope and method for use thereof
#21Multiple local probe measuring device and method
#22Sensing mode atomic force microscope