248369 ⎘
Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor; Apparatus with means for measuring, testing, or sensing with a window or port for visual observation or examination
Method for calculating a height position of silicon melt surface, method for pulling silicon single crystal, and silicon single crystal pulling apparatus
#2Microfluidic free interface diffusion techniques
#3Enclosure for controlling the environment of optical crystals
#4Microfluidic free interface diffusion techniques
#5Method for measuring liquid level in single crystal pulling apparatus employing CZ method
#6Single-crystal manufacturing apparatus and single-crystal manufacturing method
#7Microfluidic free interface diffusion techniques
#8Method of controlling single crystal diameter
#9Method for manufacturing silicon single crystal in which a crystallization temperature gradient is controlled
#10System and method for liquid silicon containment
#11Non-contact substrate support position sensing system and corresponding adjustments
#12System and method for pedestal adjustment
#13Crystallization apparatus, crystallization method, phase modulation element, device and display apparatus
#14CRYSTALLIZATION APPARATUS, OPTICAL MEMBER FOR USE IN CRYSTALLIZATION APPARATUS, CRYSTALLIZATION METHOD, MANUFACTURING METHOD OF THIN FILM TRANSISTOR, AND MANUFACTURING METHOD OF MATRIX CIRCUIT SUBSTRATE OF DISPLAY
#15Crystallization apparatus, optical member for use in crystallization apparatus, crystallization method, manufacturing method of thin film transistor, and manufacturing method of matrix circuit substrate of display
#16Crystallization apparatus, crystallization method, phase modulation element, device and display apparatus
#17Crystal growth apparatus
#18CRYSTALLIZATION APPARATUS, CRYSTALLIZATION METHOD, DEVICE, OPTICAL MODULATION ELEMENT, AND DISPLAY APPARATUS
#19Microfluidic free interface diffusion techniques
#20Mask for sequential lateral solidification and crystallization method using thereof
#21Method for continuous, in situ evaluation of entire wafers for macroscopic features during epitaxial growth
#22Melt surface position monitoring apparatus in silicon single crystal growth process
#23Transfer/inspection apparatus and transfer apparatus
#24In-situ crystalline material screening apparatus and method
#25Carbon nanohorn producing device and carbon nanohorn producing method
#26Silicon wafer and process for producing it
#27Apparatus for crystal growth of biomacromolecules
#28Crystallization apparatus, optical member for use in crystallization apparatus, crystallization method, manufacturing method of thin film transistor, and manufacturing method of matrix circuit substrate of display
#29Pulling-down apparatus and container therefor
#30Crystal growth method
#31Crystallization apparatus, crystallization method, device, optical modulation element, and display apparatus
#32Vapor-phase epitaxial apparatus and vapor phase epitaxial method
#33Mask for sequential lateral solidification and crystallization method using thereof
#34Silicon wafer and process for producing it