Kiryat Ono
Israel
21
2026-04-23
The entities that hold a legal rights for patent applications filed by inventor Shafir Dror:
Dror Shafir from Kiryat Ono, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
#2 | 2024-10-31OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
#3 | 2024-10-10METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
#4 | 2024-08-15METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES
#5 | 2023-04-27Optical phase measurement system and method
#6 | 2021-11-25OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
#7 | 2021-04-22Method and system for optical characterization of patterned samples
#8 | 2020-11-12Optical phase measurement system and method
#9 | 2020-01-23Optical phase measurement system and method
#10 | 2019-05-23Optical phase measurement method and system
#11 | 2019-05-02Optical system and method for measurements of samples
#12 | 2019-02-28Optical critical dimension metrology
#13 | 2018-11-15Method and system for optical characterization of patterned samples
#14 | 2018-05-10Optical phase measurement method and system
#15 | 2017-03-02Overlay design optimization
#16 | 2017-01-19Optical phase measurement method and system
#17 | 2016-12-15Optical critical dimension metrology
#18 | 2015-12-31Optical phase measurement method and system
#19 | 2015-12-03Optical method and system for critical dimensions and thickness characterization
#20 | 2015-11-05METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
#21 | 2015-07-30Optical method and system for measuring isolated features of a structure
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