Fishkill, New York
United States
15
2024-10-10
The entities that hold a legal rights for patent applications filed by inventor SENDELBACH Matthew:
Matthew SENDELBACH from Fishkill, US has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
#2 | 2023-03-09METROLOGY METHOD AND SYSTEM
#3 | 2022-09-29TEM-based metrology method and system
#4 | 2021-07-15TEM-based metrology method and system
#5 | 2021-04-22Method and system for optical characterization of patterned samples
#6 | 2020-12-31Process control of semiconductor fabrication based on spectra quality metrics
#7 | 2020-09-17Metrology method and system
#8 | 2020-09-03PROCESS CONTROL OF SEMICONDUCTOR FABRICATION BASED ON LINKAGE BETWEEN DIFFERENT FABRICATION STEPS
#9 | 2020-06-18Measuring complex structures in semiconductor fabrication
#10 | 2019-12-26TEM-based metrology method and system
#11 | 2018-11-15Method and system for optical characterization of patterned samples
#12 | 2016-12-15Method and system for planning metrology measurements
#13 | 2016-05-19Method and system for determining strain distribution in a sample
#14 | 2016-03-17Scatterometry method and system
#15 | 2015-11-05METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
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