Rik Jonckheere

City:

Muizen

Country:

Belgium

Published Applications:

Last publication date:

2018-03-01

Top Assignees for applications by Rik Jonckheere

The entities that hold a legal rights for patent applications filed by inventor Jonckheere Rik:

Rik Jonckheere from Muizen, BE has applied for patents for these inventions. The list has both pending applications and granted patents:

Lithographic mask for EUV lithography

Detection of contamination in EUV systems

DETECTION OF CONTAMINATION IN EUV SYSTEMS

Method and system for measuring contamination of a lithographical element

Systems and methods for UV lithography

InventorID:

2129252 ⎘