Eindhoven
Netherlands
15
2024-08-29
The entities that hold a legal rights for patent applications filed by inventor LIAN Jin:
Jin LIAN from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
METROLOGY METHOD AND ASSOCIATED METROLOGY TOOL
#2 | 2024-06-06METROLOGY TOOL CALIBRATION METHOD AND ASSOCIATED METROLOGY TOOL
#3 | 2024-01-25METROLOGY SYSTEM AND COHERENCE ADJUSTERS
#4 | 2023-09-28METHODS AND PATTERNING DEVICES AND APPARATUSES FOR MEASURING FOCUS PERFORMANCE OF A LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD
#5 | 2023-07-20ILLUMINATION APPARATUS AND ASSOCIATED METROLOGY AND LITHOGRAPHIC APPARATUSES
#6 | 2023-06-08Substrate comprising a target arrangement, and associated at least one patterning device, lithographic method and metrology method
#7 | 2020-06-18Method of measuring a parameter of a lithographic process, metrology apparatus
#8 | 2020-03-19Method for of measuring a parameter relating to a structure formed using a lithographic process
#9 | 2020-01-02Metrology apparatus, lithographic system, and method of measuring a structure
#10 | 2019-12-05Measurement apparatus and method of measuring a target
#11 | 2019-09-19Method of measuring, device manufacturing method, metrology apparatus, and lithographic system
#12 | 2019-04-18Metrology apparatus, lithographic system, and method of measuring a structure
#13 | 2019-04-11Metrology method and apparatus, computer program and lithographic system
#14 | 2018-11-08Method of measuring a parameter of interest, device manufacturing method, metrology apparatus, and lithographic system
#15 | 2018-10-18Method of measuring, device manufacturing method, metrology apparatus, and lithographic system
2325901 ⎘