Fremont, California
United States
62
2019-06-06
57
2021-06-29
These are the the leading inventors for applications assigned to DCG SYSTEMS, INC.:
DCG SYSTEMS, INC. based in Fremont, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets
#2 | 2017-01-05DIAMOND DELAYERING FOR ELECTRICAL PROBING
#3 | 2016-12-22Particle Beam Heating to Identify Defects
#4 | 2016-08-11 ✅ Patent 9,869,696 granted on 2018-01-16Method for imaging a feature using a scanning probe microscope
#5 | 2016-07-28 ✅ Patent 9,551,743 granted on 2017-01-24Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materials
#6 | 2015-10-22 ✅ Patent 9,506,947 granted on 2016-11-29System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
#7 | 2015-06-18 ✅ Patent 9,057,740 granted on 2015-06-16Probe-based data collection system with adaptive mode of probing
#8 | 2015-04-02 ✅ Patent 9,817,060 granted on 2017-11-14Optimized wavelength photon emission microscope for VLSI devices
#9 | 2014-11-27 ✅ Patent 9,322,715 granted on 2016-04-26Three-dimensional hot spot localization
#10 | 2014-10-16 ✅ Patent 9,885,878 granted on 2018-02-06Apparatus and method for annular optical power management
#11 | 2014-10-02 ✅ Patent 9,244,121 granted on 2016-01-26Systems and method for laser voltage imaging state mapping
#12 | 2014-09-25 ✅ Patent 10,191,111 granted on 2019-01-29Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets
#13 | 2014-07-31 ✅ Patent 9,098,892 granted on 2015-08-04Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side
#14 | 2014-07-10ACCUMULATING OPTICAL DETECTOR WITH SHUTTER EMULATION
#15 | 2014-05-22 ✅ Patent 8,895,923 granted on 2014-11-25System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
#16 | 2014-02-13 ✅ Patent 9,064,083 granted on 2015-06-23P and N region differentiation for image-to-CAD alignment
#17 | 2014-02-04 ✅ Patent 8,645,896 granted on 2014-02-04Method to transfer failure analysis-specific data between design houses and fab's/FA labs
#18 | 2013-11-28 ✅ Patent 9,201,096 granted on 2015-12-01Laser-assisted device alteration using synchronized laser pulses
#19 | 2013-10-03 ✅ Patent 8,983,232 granted on 2015-03-17Method for evaluating the centerline of an arbitrarily shaped object
#20 | 2013-05-16 ✅ Patent 9,361,533 granted on 2016-06-07Apparatus and method for polarization diversity imaging and alignment
#21 | 2013-05-09 ✅ Patent 9,239,357 granted on 2016-01-19System and method for modulation mapping
#22 | 2012-06-14 ✅ Patent 9,551,743 granted on 2017-01-24Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materials
#23 | 2012-04-26 ✅ Patent 9,025,020 granted on 2015-05-05Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side
#24 | 2012-03-08 ✅ Patent 8,860,447 granted on 2014-10-14Laser assisted device alteration using two-photon absorption
#25 | 2012-01-12 ✅ Patent 8,810,266 granted on 2014-08-19Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis
#26 | 2011-12-08 ✅ Patent 8,742,347 granted on 2014-06-03Three-dimensional hot spot localization
#27 | 2011-08-18 ✅ Patent 8,686,748 granted on 2014-04-01System and method for modulation mapping
#28 | 2011-06-07 ✅ Patent 7,956,625 granted on 2011-06-07Undoped silicon heat spreader window
#29 | 2010-11-04 ✅ Patent 8,754,633 granted on 2014-06-17Systems and method for laser voltage imaging state mapping
#30 | 2010-08-31 ✅ Patent 7,786,436 granted on 2010-08-31FIB based open via analysis and repair
#31 | 2010-05-13 ✅ Patent 8,159,243 granted on 2012-04-17Probe tip to device pad alignment in obscured view probing applications
#32 | 2010-05-06 ✅ Patent 8,553,322 granted on 2013-10-08Variable magnification optics with spray cooling
#33 | 2010-02-18 ✅ Patent 7,990,167 granted on 2011-08-02System and method for modulation mapping
#34 | 2010-02-18TEMPERATURE CONTROL SYSTEM FOR A DEVICE UNDER TEST
#35 | 2010-02-18 ✅ Patent 8,173,948 granted on 2012-05-08Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
#36 | 2009-07-09 ✅ Patent 8,076,951 granted on 2011-12-13Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis
#37 | 2009-06-11 ✅ Patent 8,072,589 granted on 2011-12-06System and method for photoemission-based defect detection
#38 | 2009-05-07 ✅ Patent 7,883,630 granted on 2011-02-08FIB milling of copper over organic dielectrics
#39 | 2008-12-04SUB-RESOLUTION ALIGNMENT OF IMAGES
#40 | 2008-07-24 ✅ Patent 7,636,155 granted on 2009-12-22System and method for resolving photoemission from semiconductor devices
#41 | 2008-06-19 ✅ Patent 7,842,920 granted on 2010-11-30Methods and systems of performing device failure analysis, electrical characterization and physical characterization
#42 | 2008-05-15 ✅ Patent 7,573,050 granted on 2009-08-11Column simultaneously focusing a particle beam and an optical beam
#43 | 2008-03-27 ✅ Patent 7,535,000 granted on 2009-05-19Method and system for identifying events in FIB
#44 | 2007-12-20 ✅ Patent 7,884,024 granted on 2011-02-08Apparatus and method for optical interference fringe based integrated circuit processing
#45 | 2007-12-06 ✅ Patent 7,539,966 granted on 2009-05-26Enhanced OP3 algorithms for net cuts, net joins, and probe points for a digital design
#46 | 2007-10-11 ✅ Patent 7,679,358 granted on 2010-03-16System and method for voltage noise and jitter measurement using time-resolved emission
#47 | 2007-09-06 ✅ Patent 7,466,852 granted on 2008-12-16Time resolved non-invasive diagnostics system
#48 | 2007-09-06 ✅ Patent 7,492,529 granted on 2009-02-17Bi-convex solid immersion lens
#49 | 2007-03-01 ✅ Patent 7,659,981 granted on 2010-02-09Apparatus and method for probing integrated circuits using polarization difference probing
#50 | 2007-03-01 ✅ Patent 7,733,100 granted on 2010-06-08System and method for modulation mapping
#51 | 2007-01-04 ✅ Patent 7,616,312 granted on 2009-11-10Apparatus and method for probing integrated circuits using laser illumination
#52 | 2007-01-04 ✅ Patent 7,450,245 granted on 2008-11-11Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
#53 | 2006-11-23 ✅ Patent 7,639,025 granted on 2009-12-29Collection optics integrating an objective and a SIL
#54 | 2006-11-23 ✅ Patent 7,530,034 granted on 2009-05-05Apparatus and method for circuit operation definition
#55 | 2006-08-24 ✅ Patent 7,697,146 granted on 2010-04-13Apparatus and method for optical interference fringe based integrated circuit processing
#56 | 2006-08-10 ✅ Patent 7,480,051 granted on 2009-01-20Apparatus and method for hard-docking a tester to a tiltable imager
#57 | 2006-05-25 ✅ Patent 7,439,730 granted on 2008-10-21Apparatus and method for detecting photon emissions from transistors
#58 | 2006-04-13 ✅ Patent 7,439,168 granted on 2008-10-21Apparatus and method of forming silicide in a localized manner
#59 | 2006-04-13 ✅ Patent 7,612,321 granted on 2009-11-03Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
#60 | 2006-02-09 ✅ Patent 7,478,345 granted on 2009-01-13Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
#61 | 2005-12-15 ✅ Patent 7,504,845 granted on 2009-03-17Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis
#62 | 2005-02-24 ✅ Patent 7,409,653 granted on 2008-08-05Sub-resolution alignment of images
Also check out DCG Systems, Inc.'s (Fremont, United States) applicant profile with 17 patent applications submitted.
21426 ⎘