Newark, California
United States
21
2025-11-06
The entities that hold a legal rights for patent applications filed by inventor LIN Chenxi:
Chenxi LIN from Newark, US has applied for patents for these inventions. The list has both pending applications and granted patents:
IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING
#2 | 2025-09-04STOCHASTIC-AWARE SOURCE MASK OPTIMIZATION BASED ON EDGE PLACEMENT PROBABILITY DISTRIBUTION
#3 | 2025-02-06OVERLAY METROLOGY BASED ON TEMPLATE MATCHING WITH ADAPTIVE WEIGHTING
#4 | 2025-01-23SYSTEMS AND METHODS FOR OPTIMIZING LITHOGRAPHIC DESIGN VARIABLES USING IMAGE-BASED FAILURE RATE MODEL
#5 | 2024-02-29TRAINING MACHINE LEARNING MODELS BASED ON PARTIAL DATASETS FOR DEFECT LOCATION IDENTIFICATION
#6 | 2023-12-14ACTIVE LEARNING-BASED DEFECT LOCATION IDENTIFICATION
#7 | 2023-08-31METHOD FOR ADJUSTING A PATTERNING PROCESS
#8 | 2022-09-01IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING
#9 | 2022-08-11Method for determining corrections for lithographic apparatus
#10 | 2022-01-27Method for controlling a manufacturing process and associated apparatuses
#11 | 2022-01-13Method to predict yield of a device manufacturing process
#12 | 2021-12-23Method of manufacturing devices
#13 | 2021-12-16Method for determining root cause affecting yield in a semiconductor manufacturing process
#14 | 2021-11-18METHODS FOR GENERATING CHARACTERISTIC PATTERN AND TRAINING MACHINE LEARNING MODEL
#15 | 2021-10-21Method to predict yield of a device manufacturing process
#16 | 2021-05-06Method for determining a control parameter for an apparatus utilized in a semiconductor manufacturing process
#17 | 2020-11-12Method to label substrates based on process parameters
#18 | 2020-04-02Method to predict yield of a device manufacturing process
#19 | 2020-02-13ASSIST FEATURE PLACEMENT BASED ON MACHINE LEARNING
#20 | 2019-11-14Methods of guiding process models and inspection in a manufacturing process
#21 | 2019-05-16Identification of hot spots or defects by machine learning
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