Ottawa
Canada
18
2025-05-22
The entities that hold a legal rights for patent applications filed by inventor Phaneuf Michael William:
Michael William Phaneuf from Ottawa, CA has applied for patents for these inventions. The list has both pending applications and granted patents:
MICROSCOPY IMAGING METHOD AND SYSTEM
#2 | 2024-05-30Fiducial guided cross-sectioning and lamella preparation with tomographic data collection
#3 | 2023-11-09Method for cross-section sample preparation
#4 | 2023-02-09Microscopy imaging method for 3D tomography with predictive drift tracking for multiple charged particle beams
#5 | 2022-10-06Method for cross-section sample preparation
#6 | 2021-05-27Method and system for iteratively cross-sectioning a sample to correlatively targeted sites
#7 | 2020-08-20Method for cross-section sample preparation
#8 | 2020-06-04Method and system for cross-sectioning a sample with a preset thickness or to a target site
#9 | 2018-02-22Microscopy imaging method and system
#10 | 2017-05-18Microscopy imaging method and system
#11 | 2014-08-14Microscopy imaging method and system
#12 | 2013-01-03REDEPOSITION TECHNIQUE FOR MEMBRANE ATTACHMENT
#13 | 2011-08-25Methods for performing circuit edit operations with low landing energy electron beams
#14 | 2011-08-04Apparatus and method for surface modification using charged particle beams
#15 | 2010-04-08Method and system for counting secondary particles
#16 | 2009-05-28System and method for focused ion beam data analysis
#17 | 2008-12-11Apparatus and method for surface modification using charged particle beams
#18 | 2008-03-27Method and system for identifying events in FIB
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