Inventor profile of:

Michael William Phaneuf

City:

Ottawa

Country:

Canada

Published Applications:

18

Last publication date:

2025-05-22

Top Assignees for applications by Michael William Phaneuf

The entities that hold a legal rights for patent applications filed by inventor Phaneuf Michael William:

Recent patent applications by Phaneuf Michael William

Michael William Phaneuf from Ottawa, CA has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-05-22
US20250166961A1
Electricity

MICROSCOPY IMAGING METHOD AND SYSTEM

#2 | 2024-05-30
US20240177966A1
Electricity

Fiducial guided cross-sectioning and lamella preparation with tomographic data collection

#3 | 2023-11-09
US20230358696A1
Physics

Method for cross-section sample preparation

#4 | 2023-02-09
US20230044598A1
Electricity

Microscopy imaging method for 3D tomography with predictive drift tracking for multiple charged particle beams

#5 | 2022-10-06
US20220317072A1
Physics

Method for cross-section sample preparation

#6 | 2021-05-27
US20210159046A1
Electricity

Method and system for iteratively cross-sectioning a sample to correlatively targeted sites

#7 | 2020-08-20
US20200264115A1
Physics

Method for cross-section sample preparation

#8 | 2020-06-04
US20200176218A1
Electricity

Method and system for cross-sectioning a sample with a preset thickness or to a target site

#9 | 2018-02-22
US20180053627A1
Electricity

Microscopy imaging method and system

#10 | 2017-05-18
US20170140897A1
Electricity

Microscopy imaging method and system

#11 | 2014-08-14
US20140226003A1
Electricity

Microscopy imaging method and system

#12 | 2013-01-03
US20130001191A1
Performing operations; transporting

REDEPOSITION TECHNIQUE FOR MEMBRANE ATTACHMENT

#13 | 2011-08-25
US20110204263A1
Electricity

Methods for performing circuit edit operations with low landing energy electron beams

#14 | 2011-08-04
US20110186719A1
Electricity

Apparatus and method for surface modification using charged particle beams

#15 | 2010-04-08
US20100084568A1
Electricity

Method and system for counting secondary particles

#16 | 2009-05-28
US20090135240A1
Physics

System and method for focused ion beam data analysis

#17 | 2008-12-11
US20080302954A1
Electricity

Apparatus and method for surface modification using charged particle beams

#18 | 2008-03-27
US20080073580A1
Electricity

Method and system for identifying events in FIB

InventorID:

2843 ⎘