ASHQELON
Israel
6
2023-03-09
The entities that hold a legal rights for patent applications filed by inventor SHIFRIN MICHAEL:
MICHAEL SHIFRIN from ASHQELON, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
METROLOGY METHOD AND SYSTEM
#2 | 2022-09-29TEM-based metrology method and system
#3 | 2021-07-15TEM-based metrology method and system
#4 | 2020-09-17Metrology method and system
#5 | 2019-12-26TEM-based metrology method and system
#6 | 2010-09-28Lithographic patterning for sub-90nm with a multi-layered carbon-based hardmask
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