Hideyuki OSHIMA

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2020-10-01

Top Assignees for applications by Hideyuki OSHIMA

The entities that hold a legal rights for patent applications filed by inventor OSHIMA Hideyuki:

Hideyuki OSHIMA from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Test apparatus

Semiconductor test apparatus

Semiconductor test instrument

Target value search circuit, taget value search method, and semiconductor test device using the same

Tester for testing an electronic device using oscillator and frequency divider

Semiconductor test device having clock recovery circuit

Semiconductor test apparatus for testing semiconductor device that produces output data by its internal clock timing

InventorID:

2865605 ⎘