Fremont, California
United States
28
2014-01-07
The entities that hold a legal rights for patent applications filed by inventor Lee Shing:
Shing Lee from Fremont, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Broadband reflective waveguide metal gratings and their formation
#2 | 2013-11-19Energy-assisted magnetic recording head having multiple cores of different lengths
#3 | 2013-10-29Absorption enhanced media for energy assisted magnetic recording
#4 | 2013-07-16Method and system for providing an energy assisted magnetic recording writer having an integrated NFT, heat sink, and pole
#5 | 2013-06-04Method and system for enhancing optical efficiency for an EAMR head
#6 | 2013-06-04Energy assisted magnetic recording head having a reflector for improving efficiency of the light beam
#7 | 2013-05-28Method and system for providing a molded capping layer for an energy assisted magnetic recording head
#8 | 2013-04-16Energy assisted magnetic recording disk drive using a distributed feedback laser
#9 | 2013-04-16Double optical grating
#10 | 2012-12-04EAMR head having improved optical coupling efficiency
#11 | 2012-11-27Method and system for providing an energy assisted magnetic recording disk drive having a non-conformal heat spreader
#12 | 2012-11-27Non-linear optical grating
#13 | 2012-08-21Method and system for providing an energy assisted magnetic recording disk drive having improved heat dissipation
#14 | 2012-06-28Method and system for optically coupling a laser with a transducer in an energy assisted magnetic recording disk drive
#15 | 2012-02-14Method and system for providing energy assisted magnetic recording disk drive using a vertical surface emitting laser
#16 | 2011-12-29Energy assisted magnetic recording head having laser integrated mounted to slider
#17 | 2011-09-06Method and system for mounting lasers on energy assisted magnetic recording heads
#18 | 2011-01-11Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system
#19 | 2011-01-11Fourier filters, inspection systems, and systems for fabricating fourier filters
#20 | 2010-06-15Fourier filters, systems for fabricating fourier filters, and systems and methods for inspecting a specimen using fourier filters
#21 | 2009-11-12Systems and methods for measurement of a specimen with vacuum ultraviolet light
#22 | 2009-05-19Systems configured to inspect a specimen
#23 | 2009-02-10Spectroscopic multi angle ellipsometry
#24 | 2008-10-16Systems and methods for measurement of a specimen with vacuum ultraviolet light
#25 | 2008-08-05Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system
#26 | 2008-05-06Optical system for measuring samples using short wavelength radiation
#27 | 2005-11-17Systems and methods for measurement of a specimen with vacuum ultraviolet light
#28 | 2005-11-17Systems and methods for measurement of a specimen with vacuum ultraviolet light
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