Dresden
Germany
9
2011-12-01
The entities that hold a legal rights for patent applications filed by inventor RUMIANTSEV Andrej:
Andrej RUMIANTSEV from Dresden, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Chuck for supporting and retaining a test substrate and a calibration substrate
#2 | 2011-09-22Probe station for on-wafer-measurement under EMI-shielding
#3 | 2010-04-29PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITS
#4 | 2009-12-24Chuck for supporting and retaining a test substrate and a calibration substrate
#5 | 2009-12-24METHOD FOR DETERMINATION OF ELECTRICAL PROPERTIES OF ELECTRONIC COMPONETS AND METHOD FOR CALIBRATION OF A MEASURING UNIT
#6 | 2008-11-13Process for Measuring the Impedance of Electronic Circuits
#7 | 2008-08-14METHOD FOR DETERMINING MEASUREMENT ERRORS IN SCATTERING PARAMETER MEASUREMENTS
#8 | 2008-05-29Method for calibration of a vectorial network analyzer
#9 | 2008-05-29Method for calibration of a vectorial network analyzer having more than two ports
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