Inventor profile of:

Michael Schmidt

City:

Gresham, Oregon

Country:

United States

Published Applications:

22

Last publication date:

2022-03-31

Top Assignees for applications by Michael Schmidt

The entities that hold a legal rights for patent applications filed by inventor Schmidt Michael:

Recent patent applications by Schmidt Michael

Michael Schmidt from Gresham, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-03-31
US20220102284A1
Electricity

Depositive shielding for fiducial protection from redeposition

#2 | 2019-09-05
US20190272975A1
Electricity

Automated TEM sample preparation

#3 | 2018-10-18
US20180301319A1
Electricity

Fiducial design for tilted or glancing mill operations with a charged particle beam

#4 | 2018-08-30
US20180247793A1
Electricity

GLANCING ANGLE MILL

#5 | 2017-09-07
US20170256380A1
Electricity

Automated TEM sample preparation

#6 | 2017-08-31
US20170250055A1
Electricity

High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella

#7 | 2016-05-19
US20160141147A1
Electricity

Automated TEM sample preparation

#8 | 2015-12-10
US20150357159A1
Electricity

Fiducial design for tilted or glancing mill operations with a charged particle beam

#9 | 2015-11-19
US20150330877A1
Physics

METHOD FOR PREPARING SAMPLES FOR IMAGING

#10 | 2015-10-15
US20150294834A1
Electricity

High capacity TEM grid

#11 | 2015-10-01
US20150276567A1
Physics

Method and system for reducing curtaining in charged particle beam sample preparation

#12 | 2015-09-17
US20150260784A1
Physics

Multidimensional structural access

#13 | 2015-08-27
US20150243478A1
Electricity

High aspect ratio structure analysis

#14 | 2015-08-27
US20150243477A1
Electricity

Bulk deposition for tilted mill protection

#15 | 2015-07-30
US20150214124A1
Electricity

Surface delayering with a programmed manipulator

#16 | 2014-07-10
US20140190934A1
Physics

Method for preparing samples for imaging

#17 | 2014-05-20
US13935720
Electricity

Multiple sample attachment to nano manipulator for high throughput sample preparation

#18 | 2013-09-26
US20130248354A1
Electricity

High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella

#19 | 2013-07-25
US20130186747A1
Electricity

Glancing angle mill

#20 | 2008-03-27
US20080073587A1
Performing operations; transporting

Sputtering coating of protective layer for charged particle beam processing

#21 | 2007-01-18
US20070015297A1
Physics

Failure analysis vehicle for yield enhancement with self test at speed burnin capability for reliability testing

#22 | 2005-02-24
US20050041454A1
Physics

Failure analysis vehicle for yield enhancement with self test at speed burnin capability for reliability testing

InventorID:

350014 ⎘