Beacon, New York
United States
5
2011-03-24
The entities that hold a legal rights for patent applications filed by inventor Morillo Jaime D.:
Jaime D. Morillo from Beacon, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Multilayer alignment and overlay target and measurement method
#2 | 2011-03-10Multi layer alignment and overlay target and measurement method
#3 | 2010-07-29Target and method for mask-to-wafer CD, pattern placement and overlay measurement and control
#4 | 2008-10-23Multi layer alignment and overlay target and measurement method
#5 | 2007-03-15Multi-layer alignment and overlay target and measurement method
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