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Inventor profile of:

Chris Raymond

City:

Bend, Oregon

Country:

United States

Published Applications:

Last publication date:

2010-06-03

Top Assignees for applications by Chris Raymond

The entities that hold a legal rights for patent applications filed by inventor Raymond Chris:

ACCENT OPTICAL TECHNOLOGIES, INC. 8 Bend, OR United States
Nanometrics Incorporated 5 Milpitas, CA United States

Recent patent applications by Raymond Chris

Chris Raymond from Bend, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2010-06-03

US20100135571A1

Physics

Method for evaluating microstructures on a workpiece based on the orientation of a grating on the workpiece

#2 | 2007-09-13

US20070211261A1

Physics

Method for evaluating microstructures on a workpiece based on the orientation of a grating on the workpiece

#3 | 2006-12-28

US20060289790A1

Physics

Apparatus and method for enhanced critical dimension scatterometry

#4 | 2006-12-28

US20060289789A1

Physics

Apparatus and method for enhanced critical dimension scatterometry

#5 | 2006-12-28

US20060289788A1

Physics

Apparatus and method for enhanced critical dimension scatterometry

#6 | 2006-12-21

US20060285111A1

Physics

Apparatuses and methods for enhanced critical dimension scatterometry

#7 | 2006-12-21

US20060285110A1

Physics

Apparatus and method for enhanced critical dimension scatterometry

#8 | 2006-12-14

US20060278834A1

Physics

Scatterometer having a computer system that reads data from selected pixels of the sensor array

#9 | 2006-12-07

US20060273263A1

Physics

Apparatus and method for enhanced critical dimension scatterometry

#10 | 2006-11-02

US20060244969A1

Physics

APPARATUS AND METHODS FOR SCATTEROMETRY OF OPTICAL DEVICES

#11 | 2006-11-02

US20060243912A1

Physics

Apparatus and method for enhanced critical dimension scatterometry

InventorID:

3619404 ⎘