Stojan Kanev

City:

Sacka

Country:

Germany

Published Applications:

Last publication date:

2011-09-15

Top Assignees for applications by Stojan Kanev

The entities that hold a legal rights for patent applications filed by inventor Kanev Stojan:

SUSS MicroTec Test Systems GmbH 9 Sacka, Germany
Cascade Microtech, Inc. 2 Beaverton, OR United States
SUSS MicroTec Test Systems GmbH 1 , Germany
SUSS Micro Tec Test Systems GmbH 1 Sacka, Germany

Recent patent applications by Kanev Stojan

Stojan Kanev from Sacka, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2011-09-15

US20110221461A1

Physics

Method for testing electronic components of a repetitive pattern under defined thermal conditions

#2 | 2010-11-25

US20100294053A1

Physics

Probe holder

#3 | 2010-11-18

US20100289511A1

Physics

Method for testing a test substrate under defined thermal conditions and thermally conditionable prober

#4 | 2010-04-29

US20100106439A1

Physics

PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITS

#5 | 2008-12-25

US20080315903A1

Physics

Method for measurement of a device under test

#6 | 2008-11-13

US20080281537A1

Physics

Process for Measuring the Impedance of Electronic Circuits

#7 | 2008-05-29

US20080122468A1

Physics

Probe holder for a probe for testing semiconductor components

#8 | 2008-05-29

US20080122465A1

Physics

Probe holder for a probe for testing semiconductor components

#9 | 2008-05-29

US20080122451A1

Physics

Method for calibration of a vectorial network analyzer having more than two ports

#10 | 2008-05-22

US20080116911A1

Physics

Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus

InventorID:

3693752 ⎘