Inventor profile of:

Brian L. Tessier

City:

Poughkeepsie, New York

Country:

United States

Published Applications:

15

Last publication date:

2009-12-17

Top Assignees for applications by Brian L. Tessier

The entities that hold a legal rights for patent applications filed by inventor Tessier Brian L.:

Recent patent applications by Tessier Brian L.

Brian L. Tessier from Poughkeepsie, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2009-12-17
US20090311855A1
Electricity

METHOD OF FABRICATING A GATE STRUCTURE

#2 | 2009-06-25
US20090159934A1
Electricity

Field effect device with reduced thickness gate

#3 | 2009-04-23
US20090101980A1
Electricity

METHOD OF FABRICATING A GATE STRUCTURE AND THE STRUCTURE THEREOF

#4 | 2009-01-01
US20090001465A1
Electricity

Method of forming a guard ring or contact to an SOI substrate

#5 | 2008-11-20
US20080286916A1
Electricity

METHODS OF STRESSING TRANSISTOR CHANNEL WITH REPLACED GATE

#6 | 2008-07-24
US20080173942A1
Electricity

STRUCTURE AND METHOD OF MANUFACTURING A STRAINED FinFET WITH STRESSED SILICIDE

#7 | 2008-05-15
US20080113507A1
Electricity

Poly filled substrate contact on SOI structure

#8 | 2007-12-06
US20070281405A1
Electricity

METHODS OF STRESSING TRANSISTOR CHANNEL WITH REPLACED GATE AND RELATED STRUCTURES

#9 | 2007-09-27
US20070221964A1
Electricity

Field effect device with reduced thickness gate

#10 | 2007-08-23
US20070196963A1
Electricity

Poly filled substrate contact on SOI structure

#11 | 2007-07-12
US20070158753A1
Electricity

Semiconductor device structure having low and high performance devices of same conductive type on same substrate

#12 | 2007-01-25
US20070020838A1
Electricity

Undercut and residual spacer prevention for dual stressed layers

#13 | 2007-01-11
US20070007552A1
Electricity

Self-aligned dual stressed layers for NFET and PFET

#14 | 2005-12-15
US20050275034A1
Electricity

A MANUFACTURABLE METHOD AND STRUCTURE FOR DOUBLE SPACER CMOS WITH OPTIMIZED NFET/PFET PERFORMANCE

#15 | 2005-02-22
US10881449
-

MOSFET device with in-situ doped, raised source and drain structures

InventorID:

3842998 ⎘