Milpitas, California
United States
8
2013-11-12
The entities that hold a legal rights for patent applications filed by inventor Shortt David:
David Shortt from Milpitas, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Systems and methods for inspecting specimens including specimens that have a substantially rough uppermost layer
#2 | 2009-01-08Systems and methods for inspecting a wafer with increased sensitivity
#3 | 2008-12-09Systems and methods for determining a characteristic of a specimen
#4 | 2007-12-04Methods and systems for inspecting a specimen using light scattered in different wavelength ranges
#5 | 2007-10-04Computer-implemented methods and systems for determining a configuration for a light scattering inspection system
#6 | 2007-06-14Systems and methods for inspecting a wafer with increased sensitivity
#7 | 2007-04-12Methods and systems for inspection of a wafer
#8 | 2006-09-07Enhanced simultaneous multi-spot inspection and imaging
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