Martin Perner

Buffer circuit for a memory module

Memory device and method for testing memory devices with repairable redundancy

Integrated memory and method for checking the functioning of an integrated memory

Integrated semiconductor memory device with test circuit for sense amplifier

Circuit configuration and method for measuring at least one operating parameter for an integrated circuit

Inputting and outputting operating parameters for an integrated semiconductor memory device

Integrated semiconductor memory device

Semi-conductor component, as well as a process for the in-or output of test data

Nonvolatile memory cell and methods for operating a nonvolatile memory cell

Semiconductor module and methods for functionally testing and configuring a semiconductor module

Method and apparatus for data transmission

Integrated semiconductor memory with redundant memory cells

Integrated semiconductor memory

Circuit and method for determining at least one voltage, current and/or power value for an integrated circuit

Integrated dynamic memory and operating method

Memory module and method for operating a memory module

Integrated semiconductor memory

Method for operating a semiconductor memory, and semiconductor memory

Circuit and method for evaluating and controlling a refresh rate of memory cells of a dynamic memory

Light guide configuration for serial bi-directional signal transmission, optical circuit board, and fabrication method

Semiconductor circuit and method for testing, monitoring and application-near setting of a semiconductor circuit

Memory arrangement in a computer system

Sheet-like electrooptical component, light-guide configuration for serial, bidirectional signal transmission and optical printed circuit board