Munich
Germany
34
2022-10-20
The entities that hold a legal rights for patent applications filed by inventor Winkler Dieter:
Dieter Winkler from Munich, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Charged particle beam apparatus, multi-beamlet assembly, and method of inspecting a specimen
#2 | 2022-09-01Method of influencing a charged particle beam, multipole device, and charged particle beam apparatus
#3 | 2021-11-25Charged particle beam device and method for inspecting and/or imaging a sample
#4 | 2021-11-25Charged particle beam device and method for inspecting and/or imaging a sample
#5 | 2021-08-05Method of operating a charged particle gun, charged particle gun, and charged particle beam device
#6 | 2020-12-08Method of operating a charged particle gun, charged particle gun, and charged particle beam device
#7 | 2020-06-25Charged particle beam device, interchangeable multi-aperture arrangement for a charged particle beam device, and method for operating a charged particle beam device
#8 | 2017-03-16System for imaging a secondary charged particle beam with adaptive secondary charged particle optics
#9 | 2015-08-13SECONDARY ELECTRON OPTICS AND DETECTION DEVICE
#10 | 2015-07-30Charged particle beam device with dynamic focus and method of operating thereof
#11 | 2015-06-04Multi-beam system for high throughput EBI
#12 | 2015-01-22Switchable multi perspective detector, optics therefore and method of operating thereof
#13 | 2014-06-26SECONDARY ELECTRON OPTICS AND DETECTION DEVICE
#14 | 2013-10-17Switchable multi perspective detector, optics therefor and method of operating thereof
#15 | 2013-08-22CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERATING THEREOF
#16 | 2011-12-29GAS ION SOURCE WITH HIGH MECHANICAL STABILITY
#17 | 2010-07-29High resolution gas field ion column
#18 | 2010-05-06Dual mode gas field ion source
#19 | 2010-01-14METHOD OF PREPARING AN ULTRA SHARP TIP, APPARATUS FOR PREPARING AN ULTRA SHARP TIP, AND USE OF AN APPARATUS
#20 | 2009-11-26Ultra high precision measurement tool
#21 | 2009-10-15Stable emission gas ion source and method for operation thereof
#22 | 2009-06-11High resolution gas field ion column with reduced sample load
#23 | 2009-05-14Charged particle source with automated tip formation
#24 | 2009-03-05Gas ion source with high mechanical stability
#25 | 2009-01-22Modular gas ion source
#26 | 2008-12-18Multi-function module for an electron beam column
#27 | 2008-06-19Gas field ION source for multiple applications
#28 | 2008-03-20Charged particle beam device with a gas field ion source and a gas supply system
#29 | 2007-06-28Electron anti-fogging baffle used as a detector
#30 | 2007-06-21Chamber with low electron stimulated desorption
#31 | 2007-04-19Electron beam column for writing shaped electron beams
#32 | 2007-04-05Electrostatic deflection system with low aberrations and vertical beam incidence
#33 | 2007-04-05Electrostatic deflection system with impedance matching for high positioning accuracy
#34 | 2006-10-26Imaging system with multi source array
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