Haifa
Israel
9
2019-03-28
The entities that hold a legal rights for patent applications filed by inventor Sela Ilan:
Ilan Sela from Haifa, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology
#2 | 2018-04-19Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology
#3 | 2017-05-25Systems for providing illumination in optical metrology
#4 | 2015-04-30Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology
#5 | 2015-02-05Metrology systems and methods
#6 | 2014-08-28Systems for providing illumination in optical metrology
#7 | 2013-09-05Metrology systems and methods
#8 | 2011-03-24Metrology systems and methods
#9 | 2008-10-07Apparatus and methods for reducing tool-induced shift during overlay metrology
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