Thin Van Luu

City:

Wetzlar

Country:

Germany

Published Applications:

Last publication date:

2008-08-28

Top Assignees for applications by Thin Van Luu

The entities that hold a legal rights for patent applications filed by inventor Van Luu Thin:

Thin Van Luu from Wetzlar, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for acquiring high-resolution images of defects on the upper surface of the wafer edge

Method of learning a knowledge-based database used in automatic defect classification

Method for defect segmentation in features on semiconductor substrates

InventorID:

4239870 ⎘