Inventor profile of:

Mark Randolph

City:

San Jose, California

Country:

United States

Published Applications:

35

Last publication date:

2014-08-21

Top Assignees for applications by Mark Randolph

The entities that hold a legal rights for patent applications filed by inventor Randolph Mark:

Recent patent applications by Randolph Mark

Mark Randolph from San Jose, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2014-08-21
US20140233339A1
Physics

APPARATUS AND METHOD TO REDUCE BIT LINE DISTURBS

#2 | 2013-09-12
US20130237022A1
Electricity

Method and apparatus for protection against process-induced charging

#3 | 2010-12-16
US20100314753A1
Electricity

System and method for reducing process-induced charging

#4 | 2010-09-23
US20100240210A1
Electricity

Strapping contact for charge protection

#5 | 2010-02-04
US20100027350A1
Physics

Flash memory programming and verification with reduced leakage current

#6 | 2009-07-30
US20090189212A1
Electricity

ELECTRONIC DEVICE HAVING A DOPED REGION WITH A GROUP 13 ATOM

#7 | 2009-06-25
US20090159958A1
Electricity

ELECTRONIC DEVICE INCLUDING A SILICON NITRIDE LAYER AND A PROCESS OF FORMING THE SAME

#8 | 2009-06-18
US20090155992A1
Electricity

High K stack for non-volatile memory

#9 | 2008-11-13
US20080279014A1
Physics

Multi-phase wordline erasing for flash memory

#10 | 2008-06-26
US20080151590A1
Electricity

Method and apparatus for protection against process-induced charging

#11 | 2008-06-26
US20080150007A1
Electricity

Variable salicide block for resistance equalization in an array

#12 | 2008-06-19
US20080142889A1
Electricity

Strapping contact for charge protection

#13 | 2008-06-12
US20080135918A1
Electricity

P-channel NAND in isolated N-well

#14 | 2008-06-03
US11371023
-

Oxygen elimination for device processing

#15 | 2008-05-29
US20080123384A1
Physics

Select transistor using buried bit line from core

#16 | 2008-04-29
US11008233
-

Memory cell having enhanced high-K dielectric

#17 | 2008-03-04
US11416551
-

Method for determining wordline critical dimension in a memory array and related structure

#18 | 2007-11-22
US20070267686A1
Electricity

System and method for reducing process-induced charging

#19 | 2007-10-11
US20070237003A1
Physics

Flash memory programming and verification with reduced leakage current

#20 | 2007-09-20
US20070215932A1
Electricity

Memory cell system using silicon-rich nitride

#21 | 2007-08-28
US11146126
-

System and method for reducing process-induced charging

#22 | 2007-05-24
US20070115730A1
Physics

Methods and systems for high write performance in multi-bit flash memory devices

#23 | 2007-04-17
US11037477
-

Methods and systems for high write performance in multi-bit flash memory devices

#24 | 2007-02-13
US10862636
-

LDC implant for mirrorbit to improve Vt roll-off and form sharper junction

#25 | 2007-01-30
US11193391
-

Methods and systems for reducing the threshold voltage distribution following a memory cell erase

#26 | 2007-01-23
US11062641
-

System and method for erasing a memory cell

#27 | 2006-12-28
US20060291282A1
Physics

Flash memory cell and methods for programming and erasing

#28 | 2006-11-30
US20060268593A1
Physics

Read-only memory array with dielectric breakdown programmability

#29 | 2006-10-26
US20060240635A1
Electricity

Self-aligned STI SONOS

#30 | 2006-10-10
US10841850
-

Flash memory cell and methods for programming and erasing

#31 | 2006-09-28
US20060216888A1
Electricity

High K stack for non-volatile memory

#32 | 2006-07-04
US11008263
-

One stack with steam oxide for charge retention

#33 | 2006-05-04
US20060091439A1
Electricity

System and method for protecting semiconductor devices

#34 | 2005-08-23
US10863933
-

Ramp source hot-hole programming for trap based non-volatile memory devices

#35 | 2005-05-31
US9891885
-

ESD implant following spacer deposition

InventorID:

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