David Sturtevant

City:

Gresham, Oregon

Country:

United States

Published Applications:

Last publication date:

2007-10-25

Top Assignees for applications by David Sturtevant

The entities that hold a legal rights for patent applications filed by inventor Sturtevant David:

David Sturtevant from Gresham, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Multi-layer registration and dimensional test mark for scatterometrical measurement

Multi-layer registration and dimensional test mark for scatterometrical measurement

Wafer edge structure measurement method

InventorID:

4508785 ⎘