McKinney, Texas
United States
16
2025-05-01
The entities that hold a legal rights for patent applications filed by inventor Burch Richard:
Richard Burch from McKinney, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Sequenced Approach for Determining Wafer Path Quality
#2 | 2024-10-31Predicting Equipment Fail Mode from Process Trace
#3 | 2023-11-23Wafer bin map based root cause analysis
#4 | 2022-03-03Sequenced Approach For Determining Wafer Path Quality
#5 | 2022-02-10Pattern-enhanced spatial correlation of test structures to die level responses
#6 | 2022-01-27Automatic window generation for process trace
#7 | 2022-01-27Predicting equipment fail mode from process trace
#8 | 2021-11-04Wafer bin map based root cause analysis
#9 | 2021-10-28Abnormal wafer image classification
#10 | 2021-09-09Predicting die susceptible to early lifetime failure
#11 | 2021-05-13Collaborative learning model for semiconductor applications
#12 | 2021-04-22Die level product modeling without die level input data
#13 | 2021-04-22Machine learning variable selection and root cause discovery by cumulative prediction
#14 | 2021-04-08Anomalous equipment trace detection and classification
#15 | 2007-12-13Method and system for failure signal detection analysis
#16 | 2006-04-04Extraction method of defect density and size distributions
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