David Abercrombie

City:

Gresham, Oregon

Country:

United States

Published Applications:

Last publication date:

2007-02-06

Top Assignees for applications by David Abercrombie

The entities that hold a legal rights for patent applications filed by inventor Abercrombie David:

David Abercrombie from Gresham, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for analyzing manufacturing data

Apparatus for wafer patterning to reduce edge exclusion zone

Method of wafer patterning for reducing edge exclusion zone

Optimization of die yield in a silicon wafer “sweet spot”

Method to selectively identify reliability risk die based on characteristics of local regions on the wafer

Method for calculating high-resolution wafer parameter profiles

Method to selectively identify reliability risk die based on characteristics of local regions on the wafer

Method of isolating sources of variance in parametric data

InventorID:

4618647 ⎘