Campbell, California
United States
22
2022-08-04
The entities that hold a legal rights for patent applications filed by inventor WANG JOE:
JOE WANG from Campbell, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Multi-cell detector for charged particles
#2 | 2022-03-03System and method for bare wafer inspection
#3 | 2020-09-10Multi-cell detector for charged particles
#4 | 2020-07-30Detection of buried features by backscattered particles
#5 | 2020-01-23System and method for bare wafer inspection
#6 | 2016-09-06Method and system for enhancing image quality
#7 | 2016-02-04Energy filter for charged particle beam apparatus
#8 | 2015-04-07Method and system for enhancing image quality
#9 | 2014-10-02Dynamic focus adjustment with optical height detection apparatus in electron beam system
#10 | 2013-12-12Particle detection system
#11 | 2012-06-14Particle detection system
#12 | 2011-12-01Movable detector for charged particle beam inspection or review
#13 | 2011-10-27Particle detection system
#14 | 2011-10-27Dynamic focus adjustment with optical height detection apparatus in electron beam system
#15 | 2011-09-08Charged particle beam detection unit with multi type detection subunits
#16 | 2010-10-28System and method for a charged particle beam
#17 | 2010-06-17E-beam defect review system
#18 | 2010-06-10Operation stage for wafer edge inspection and review
#19 | 2010-04-29Electron beam apparatus
#20 | 2010-03-25Method for regulating scanning sample surface charge in continuous and leap-and-scan scanning mode imaging process
#21 | 2008-12-25Charged particle system including segmented detection elements
#22 | 2008-05-29System and method for a charged particle beam
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