Mike Von Den Hoff

City:

Munich

Country:

Germany

Published Applications:

Last publication date:

2022-09-29

Top Assignees for applications by Mike Von Den Hoff

The entities that hold a legal rights for patent applications filed by inventor Hoff Mike Von Den:

Mike Von Den Hoff from Munich, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

IMAGING REFLECTOMETRY FOR INLINE SCREENING

Advanced in-line part average testing

Qualifying patterns, patterning processes, or patterning apparatus in the fabrication of microlithographic patterns

InventorID:

6034080 ⎘