Nirasaki
Japan
9
2008-07-10
The entities that hold a legal rights for patent applications filed by inventor Takekoshi Kiyoshi:
Kiyoshi Takekoshi from Nirasaki, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Probe and probe card
#2 | 2008-01-24Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
#3 | 2007-10-04Inspection apparatus to break the oxide of an electrode by fritting phenomenon
#4 | 2006-08-31Inspection method and inspection apparatus
#5 | 2006-08-15Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
#6 | 2006-06-13Inspection method and inspection apparatus
#7 | 2005-11-17Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
#8 | 2005-09-22Vacuum prober and vacuum probe method
#9 | 2005-01-06Dicing method, method of inspecting integrated circuit element, substrate holding device, and pressure sensitive adhesive film
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