Kfar Manda
Israel
17
2018-04-12
The entities that hold a legal rights for patent applications filed by inventor Abdulhalim Ibrahim:
Ibrahim Abdulhalim from Kfar Manda, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
Periodic patterns and technique to control misalignment between two layers
#2 | 2017-11-23Apparatus and methods for detecting overlay errors using scatterometry
#3 | 2017-02-09Periodic patterns and technique to control misalignment between two layers
#4 | 2016-03-24Periodic patterns and technique to control misalignment between two layers
#5 | 2015-10-22Periodic patterns and techniques to control misalignment between two layers
#6 | 2014-01-23Periodic patterns and technique to control misalignment between two layers
#7 | 2010-07-06Methods and systems for determining a critical dimension and overlay of a specimen
#8 | 2010-03-25Periodic patterns and technique to control misalignment between two layers
#9 | 2009-09-17Periodic patterns and technique to control misaligment between two layers
#10 | 2007-06-07Periodic patterns and technique to control misalignment between two layers
#11 | 2007-04-26Spectroscopic scatterometer system
#12 | 2007-02-06Spectroscopic scatterometer system
#13 | 2006-11-23Periodic patterns and technique to control misalignment between two layers
#14 | 2006-06-22Periodic patterns and technique to control misalignment between two layers
#15 | 2006-03-30Periodic patterns and technique to control misalignment between two layers
#16 | 2005-09-22Periodic patterns and technique to control misalignment
#17 | 2005-07-21Periodic patterns and technique to control misalignment between two layers
620922 ⎘