Friedewald
Germany
7
2014-08-28
The entities that hold a legal rights for patent applications filed by inventor Teich Michael:
Michael Teich from Friedewald, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Method for verifying a test substrate in a prober under defined thermal conditions
#2 | 2014-01-30Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
#3 | 2011-10-06Method for verifying a test substrate in a prober under defined thermal conditions
#4 | 2010-11-18Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
#5 | 2010-05-06Method for increasing the accuracy of the positioning of a first object relative to a second object
#6 | 2006-05-02Test apparatus with loading device
#7 | 2005-03-08Substrate-holding device for testing circuit arrangements on substrates
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