Austin, Texas
United States
13
2022-06-16
The entities that hold a legal rights for patent applications filed by inventor Smith Mark D.:
Mark D. Smith from Austin, US has applied for patents for these inventions. The list has both pending applications and granted patents:
System and method for determining post bonding overlay
#2 | 2019-04-11COGNITIVE HEALTH CARE VITAL SIGN DETERMINATION TO NEGATE WHITE COAT HYPERTENSION IMPACT
#3 | 2019-04-11COGNITIVE HEALTH CARE VITAL SIGN DETERMINATION TO NEGATE WHITE COAT HYPERTENSION IMPACT
#4 | 2017-11-30System and method for fabricating metrology targets oriented with an angle rotated with respect to device features
#5 | 2017-02-16Process-sensitive metrology systems and methods
#6 | 2017-01-26Metrology target design for tilted device designs
#7 | 2016-11-10Model-based hot spot monitoring
#8 | 2016-10-06Method and system for determining in-plane distortions in a substrate
#9 | 2016-09-01Metrology using overlay and yield critical patterns
#10 | 2014-03-06Photoresist simulation
#11 | 2011-05-12Photoresist simulation
#12 | 2011-03-03Spin coating modeling
#13 | 2006-09-07Target acquisition and overlay metrology based on two diffracted orders imaging
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