Zichron Ya'akov
Israel
30
2017-11-23
The entities that hold a legal rights for patent applications filed by inventor Adel Michael:
Michael Adel from Zichron Ya'akov, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
Apparatus and methods for detecting overlay errors using scatterometry
#2 | 2016-10-27Apparatus for measuring overlay errors
#3 | 2016-07-07Metrology target identification, design and verification
#4 | 2016-02-18Apparatus and methods for detecting overlay errors using scatterometry
#5 | 2016-02-18In-line heated solar thermal storage collector
#6 | 2015-03-19System and method for temperature limiting in a sealed solar energy collector
#7 | 2014-12-09Flexible scatterometry metrology system and method
#8 | 2014-06-19Method of removal of snow or ice coverage from solar collectors
#9 | 2012-11-22System and method for temperature limiting in a sealed solar energy collector
#10 | 2011-11-03Solar thermal collecting system
#11 | 2011-07-21Method And System For Allocating Solar Radiation Between Multiple Applications
#12 | 2010-09-28Overlay metrology and control method
#13 | 2010-04-15Apparatus and methods for detecting overlay errors using scatterometry
#14 | 2009-12-10Enhanced OVL dummy field enabling “on-the-fly” OVL measurement methods
#15 | 2009-11-26Overlay marks and methods of manufacturing such marks
#16 | 2008-05-06Measuring phase errors on phase shift masks
#17 | 2008-04-24Apparatus and methods for detecting overlay errors using scatterometry
#18 | 2008-03-27Method for generating a design rule map having spatially varying overlay budget
#19 | 2008-01-31Overlay marks, methods of overlay mark design and methods of overlay measurements
#20 | 2008-01-08Apparatus and methods for detecting overlay errors using scatterometry
#21 | 2007-08-16Overlay metrology using the near infra-red spectral range
#22 | 2007-02-20Overlay marks, methods of overlay mark design and methods of overlay measurements
#23 | 2007-02-13Overlay marks, methods of overlay mark design and methods of overlay measurements
#24 | 2006-09-14Overlay marks, methods of overlay mark design and methods of overlay measurements
#25 | 2006-08-10Overlay marks, methods of overlay mark design and methods of overlay measurements
#26 | 2006-07-11Method and mark for metrology of phase errors on phase shift masks
#27 | 2006-06-27Overlay marks, methods of overlay mark design and methods of overlay measurements
#28 | 2006-02-23Overlay marks, methods of overlay mark design and methods of overlay measurements
#29 | 2006-01-10Overlay marks, methods of overlay mark design and methods of overlay measurements
#30 | 2005-07-26Overlay marks, methods of overlay mark design and methods of overlay measurements
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