Inventor profile of:

John Gerling

City:

Livermore, California

Country:

United States

Published Applications:

15

Last publication date:

2025-12-18

Top Assignees for applications by John Gerling

The entities that hold a legal rights for patent applications filed by inventor Gerling John:

Recent patent applications by Gerling John

John Gerling from Livermore, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-12-18
US20250385066A1
Electricity

HIGH-VOLTAGE COLUMN WITH PERMANENT MAGNET LENS AND POSITIVE WAFER BIAS FOR OVERLAY

#2 | 2025-10-09
US20250316437A1
Electricity

ULTRA-HIGH SENSITIVITY HYBRID INSPECTION WITH FULL WAFER COVERAGE CAPABILITY

#3 | 2024-01-11
US20240014000A1
Electricity

MINIATURE ELECTRON OPTICAL COLUMN WITH A LARGE FIELD OF VIEW

#4 | 2023-10-12
US20230326704A1
Electricity

MINIATURE HYBRID ELECTRON BEAM COLUMN

#5 | 2022-12-15
US20220399220A1
Electricity

Segmented multi-channel, backside illuminated, solid state detector with a through-hole for detecting secondary and backscattered electrons

#6 | 2021-03-25
US20210090844A1
Electricity

MULTI-COLUMN SCANNING ELECTRON MICROSCOPY SYSTEM

#7 | 2019-10-08
US15969555
Electricity

Array-based characterization tool

#8 | 2018-12-13
US20180358200A1
Electricity

Multi-column scanning electron microscopy system

#9 | 2018-08-09
US20180226219A1
Electricity

Multi-column scanning electron microscopy system

#10 | 2015-06-25
US20150179327A1
Electricity

Apparatus and method for fine-tuning magnet arrays with localized energy delivery

#11 | 2015-03-19
US20150076697A1
Electricity

DUMMY BARRIER LAYER FEATURES FOR PATTERNING OF SPARSELY DISTRIBUTED METAL FEATURES ON THE BARRIER WITH CMP

#12 | 2015-03-19
US20150076350A1
Electricity

Non-invasive charged particle beam monitor

#13 | 2015-03-12
US20150069234A1
Electricity

Asymmetrical detector design and methodology

#14 | 2014-08-28
US20140238970A1
Electricity

Solid state light source assisted processing

#15 | 2014-08-07
US20140218503A1
Physics

Apparatus and method for optical inspection, magnetic field and height mapping

InventorID:

860752 ⎘