Inventor profile of:

Ge Cong

City:

Pleasanton, California

Country:

United States

Published Applications:

17

Last publication date:

2025-09-25

Top Assignees for applications by Ge Cong

The entities that hold a legal rights for patent applications filed by inventor Cong Ge:

Recent patent applications by Cong Ge

Ge Cong from Pleasanton, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-09-25
US20250297867A1
Physics

LINE MARKING DETECTION FOR AUTONOMOUS AND SEMI-AUTONOMOUS SYSTEMS AND APPLICATIONS

#2 | 2025-08-21
US20250265848A1
Physics

FEATURE IDENTIFICATION USING LANGUAGE MODELS FOR AUTONOMOUS SYSTEMS AND APPLICATIONS

#3 | 2025-06-19
US20250200283A1
Physics

USING LARGE LANGUAGE MODELS TO AUGMENT PERCEPTION DATA IN ENVIRONMENT RECONSTRUCTION SYSTEMS AND APPLICATIONS

#4 | 2025-03-06
US20250078532A1
Physics

PATH MARKING DETECTION AND CLASSIFICATION FOR AUTONOMOUS AND SEMI-AUTONOMOUS SYSTEMS AND APPLICATIONS

#5 | 2024-12-19
US20240419907A1
Physics

USING LARGE LANGUAGE MODELS FOR SIMILARITY DETERMINATIONS IN CONTENT GENERATION SYSTEMS AND APPLICATIONS

#6 | 2024-12-19
US20240419904A1
Physics

USING LANGUAGE MODELS TO VERIFY MAP DATA IN MAP GENERATION SYSTEMS AND APPLICATIONS

#7 | 2024-12-19
US20240419903A1
Physics

PROCESSING SENSOR DATA USING LANGUAGE MODELS IN MAP GENERATION SYSTEMS AND APPLICATIONS

#8 | 2024-05-16
US20240161272A1
Physics

MULTIMODE DEFECT DETECTION

#9 | 2022-12-01
US20220383470A1
Physics

SYSTEM AND METHOD FOR OPTICAL WAFER CHARACTERIZATION WITH IMAGE UP-SAMPLING

#10 | 2022-03-03
US20220067898A1
Physics

Setting up inspection of a specimen

#11 | 2022-02-10
US20220044391A1
Physics

Deep learning based defect detection

#12 | 2021-10-28
US20210334989A1
Physics

Image alignment for noisy images

#13 | 2021-05-06
US20210133989A1
Physics

BBP assisted defect detection flow for SEM images

#14 | 2020-05-07
US20200143528A1
Physics

System and method for determining type and size of defects on blank reticles

#15 | 2016-12-29
US20160381265A1
Electricity

Cassette attachment device for detecting intensity of test strip cassette

#16 | 2014-08-07
US20140219885A1
Physics

Method for fast test strip intensity recognition

#17 | 2012-01-03
US12042329
-

Detection of thin line for selective sensitivity during reticle inspection

InventorID:

862016 ⎘