Milpitas, California
United States
36
2024-10-24
36
2025-01-28
These are the the leading inventors for applications assigned to KLA Corp.:
KLA Corp. based in Milpitas, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Ensemble of deep learning models for defect review in high volume manufacturing
#2 | 2024-09-05 ✅ Patent 12,190,500 granted on 2025-01-07Detecting defects on specimens
#3 | 2024-05-30 ✅ Patent 12,190,498 granted on 2025-01-07Print check repeater defect detection
#4 | 2024-04-11 ✅ Patent 12,148,639 granted on 2024-11-19Correcting target locations for temperature in semiconductor applications
#5 | 2023-06-22 ✅ Patent 12,080,050 granted on 2024-09-03Machine learning using a global texture characteristic for semiconductor-based applications
#6 | 2023-04-13 ✅ Patent 11,868,689 granted on 2024-01-09Systems and methods for setting up a physics-based model
#7 | 2023-04-06 ✅ Patent 11,749,495 granted on 2023-09-05Bandpass charged particle energy filtering detector for charged particle tools
#8 | 2023-03-30 ✅ Patent 11,727,556 granted on 2023-08-15Defect detection for multi-die masks
#9 | 2023-01-05 ✅ Patent 11,887,296 granted on 2024-01-30Setting up care areas for inspection of a specimen
#10 | 2022-11-24 ✅ Patent 11,983,865 granted on 2024-05-14Deep generative model-based alignment for semiconductor applications
#11 | 2022-03-31 ✅ Patent 11,748,871 granted on 2023-09-05Alignment of a specimen for inspection and other processes
#12 | 2022-03-03 ✅ Patent 11,748,872 granted on 2023-09-05Setting up inspection of a specimen
#13 | 2022-02-10 ✅ Patent 11,776,108 granted on 2023-10-03Deep learning based defect detection
#14 | 2022-02-10 ✅ Patent 11,644,756 granted on 2023-05-093D structure inspection or metrology using deep learning
#15 | 2022-02-03 ✅ Patent 11,328,410 granted on 2022-05-10Deep generative models for optical or other mode selection
#16 | 2022-02-03 ✅ Patent 11,631,169 granted on 2023-04-18Inspection of noisy patterned features
#17 | 2021-12-09 ✅ Patent 11,328,435 granted on 2022-05-10Image alignment setup for specimens with intra- and inter-specimen variations using unsupervised learning and adaptive database generation methods
#18 | 2021-11-04 ✅ Patent 12,051,183 granted on 2024-07-30Training a machine learning model to generate higher resolution images from inspection images
#19 | 2021-11-04 ✅ Patent 11,328,411 granted on 2022-05-10Print check repeater defect detection
#20 | 2021-10-28 ✅ Patent 11,494,924 granted on 2022-11-08Image alignment for noisy images
#21 | 2021-09-23 ✅ Patent 11,330,164 granted on 2022-05-10Determining focus settings for specimen scans
#22 | 2021-09-23 ✅ Patent 11,221,300 granted on 2022-01-11Determining metrology-like information for a specimen using an inspection tool
#23 | 2021-09-02 ✅ Patent 11,961,219 granted on 2024-04-16Generative adversarial networks (GANs) for simulating specimen images
#24 | 2021-08-19 ✅ Patent 11,494,895 granted on 2022-11-08Detecting defects in array regions on specimens
#25 | 2021-04-29 ✅ Patent 11,087,449 granted on 2021-08-10Deep learning networks for nuisance filtering
#26 | 2021-04-15 ✅ Patent 11,415,531 granted on 2022-08-16Statistical learning-based mode selection for multi-mode inspection
#27 | 2021-04-01 ✅ Patent 11,580,650 granted on 2023-02-14Multi-imaging mode image alignment
#28 | 2021-04-01 ✅ Patent 11,416,982 granted on 2022-08-16Controlling a process for inspection of a specimen
#29 | 2021-01-14 ✅ Patent 11,619,592 granted on 2023-04-04Selecting defect detection methods for inspection of a specimen
#30 | 2020-12-24 ✅ Patent 11,581,692 granted on 2023-02-14Controlling pressure in a cavity of a light source
#31 | 2020-12-03 ✅ Patent 11,499,924 granted on 2022-11-15Determining one or more characteristics of light in an optical system
#32 | 2020-10-15 ✅ Patent 11,114,324 granted on 2021-09-07Defect candidate generation for inspection
#33 | 2020-10-15 ✅ Patent 11,551,348 granted on 2023-01-10Learnable defect detection for semiconductor applications
#34 | 2020-08-27 ✅ Patent 11,276,161 granted on 2022-03-15Reference image generation for semiconductor applications
#35 | 2020-03-26 ✅ Patent 10,866,197 granted on 2020-12-15Dispositioning defects detected on extreme ultraviolet photomasks
#36 | 2020-03-19 ✅ Patent 10,923,317 granted on 2021-02-16Detecting defects in a logic region on a wafer
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