San Jose, California
United States
5
2014-10-02
The entities that hold a legal rights for patent applications filed by inventor Borowicz Mark:
Mark Borowicz from San Jose, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Methods and Systems for Measuring a Characteristic of a Substrate or Preparing a Substrate for Analysis
#2 | 2009-02-10Charge-control method and apparatus for electron beam imaging
#3 | 2008-10-30Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis
#4 | 2007-12-04Systems configured to reduce distortion of a resist during a metrology process and systems and methods for reducing alteration of a specimen during analysis
#5 | 2005-10-06Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis
917383 ⎘