Timrat
Israel
33
2026-06-04
The entities that hold a legal rights for patent applications filed by inventor Bachar Ohad:
Ohad Bachar from Timrat, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
OVERLAY METROLOGY TARGET
#2 | 2026-05-21MULTI AXES MOTION MECHANISM ENABLING MULTIPLE OPTICAL COLUMNS METROLOGY SYSTEM
#3 | 2026-03-05SYSTEM AND METHOD FOR TARGET CENTERING DETECTION IN OVERLAY METROLOGY
#4 | 2025-05-01MASSIVE MEASUREMENT SAMPLING USING MULTIPLE CHUCKS AND OPTICAL COLUMNS
#5 | 2025-02-13OVERLAY METROLOGY TARGET FOR DIE-TO-WAFER OVERLAY METROLOGY
#6 | 2024-03-21SYSTEM AND METHOD FOR ACQUIRING ALIGNMENT MEASUREMENTS OF STRUCTURES OF A BONDED SAMPLE
#7 | 2023-12-26Systems and methods for metrology with layer-specific illumination spectra
#8 | 2023-10-12EXTRA TALL TARGET METROLOGY
#9 | 2022-10-27Systems and methods for improved metrology for semiconductor device wafers
#10 | 2021-12-16Metrology system and method for measuring diagonal diffraction-based overlay targets
#11 | 2020-10-22High-brightness illumination source for optical metrology
#12 | 2019-10-10Localized telecentricity and focus optimization for overlay metrology
#13 | 2019-04-11Nano-structured non-polarizing beamsplitter
#14 | 2019-03-28Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology
#15 | 2019-01-31Spectral filter for high-power fiber illumination sources
#16 | 2018-10-11Systems and methods for metrology with layer-specific illumination spectra
#17 | 2018-04-19Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology
#18 | 2018-02-22System and method for generating multi-channel tunable illumination from a broadband source
#19 | 2017-12-07System and method for spectral tuning of broadband light sources
#20 | 2017-05-25Systems for providing illumination in optical metrology
#21 | 2016-10-27Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology
#22 | 2016-10-20Spectral control system
#23 | 2015-11-05Apodization for pupil imaging scatterometry
#24 | 2015-04-30Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology
#25 | 2015-02-05Metrology systems and methods
#26 | 2014-08-28Systems for providing illumination in optical metrology
#27 | 2014-06-19Spectral control system
#28 | 2014-05-29Apodization for pupil imaging scatterometry
#29 | 2014-04-24Phase characterization of targets
#30 | 2013-09-05Metrology systems and methods
#31 | 2013-02-21Overlay metrology by pupil phase analysis
#32 | 2012-02-09Optics symmetrization for metrology
#33 | 2011-03-24Metrology systems and methods
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