Tomoyuki YAMANE

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2014-12-04

Top Assignees for applications by Tomoyuki YAMANE

The entities that hold a legal rights for patent applications filed by inventor YAMANE Tomoyuki:

Tomoyuki YAMANE from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Test system

Semiconductor memory test apparatus and method for address generation for defect analysis

Measuring apparatus, measuring method, and test apparatus

InventorID:

994635 ⎘