Fremont, California
United States
20
2026-04-09
13
2025-04-22
These are the the leading inventors for applications assigned to NOVA MEASURING INSTRUMENTS INC.:
NOVA MEASURING INSTRUMENTS INC. based in Fremont, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
A HIGH BRIGHTNESS PRIMARY X-RAY SOURCE FOR IN-LINE XPS AND XRF METROLOGY
#2 | 2026-03-19SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATTEROMETRY
#3 | 2026-01-29ADAPTIVE COUNT RATE MODULATION TO INCREASE DEPTH PROFILE DYNAMIC RANGE IN SECONDARY ION MASS SPECTROSCOPY
#4 | 2025-10-09CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE MEASUREMENTS
#5 | 2025-02-27PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY USING UNSUPERVISED MACHINE LEARNING
#6 | 2025-02-13METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
#7 | 2025-01-02PATTERNED X-RAY EMITTING TARGET
#8 | 2024-12-05 ✅ Patent 12,281,893 granted on 2025-04-22Characterizing and measuring in small boxes using XPS with multiple measurements
#9 | 2024-10-17 ✅ Patent 12,360,063 granted on 2025-07-15SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATTEROMETRY
#10 | 2024-03-14 ✅ Patent 12,165,863 granted on 2024-12-10Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
#11 | 2024-02-08 ✅ Patent 12,158,437 granted on 2024-12-03XPS metrology for process control in selective deposition
#12 | 2023-12-21 ✅ Patent 12,066,391 granted on 2024-08-20Method and system for non-destructive metrology of thin layers
#13 | 2023-09-14 ✅ Patent 11,988,502 granted on 2024-05-21Characterizing and measuring in small boxes using XPS with multiple measurements
#14 | 2022-12-08 ✅ Patent 11,996,259 granted on 2024-05-28Patterned x-ray emitting target
#15 | 2022-07-14 ✅ Patent 11,823,883 granted on 2023-11-21Mass spectrometer detector and system and method using the same
#16 | 2022-05-19 ✅ Patent 11,852,467 granted on 2023-12-26Method and system for monitoring deposition process
#17 | 2021-12-02 ✅ Patent 11,733,035 granted on 2023-08-22Feed-forward of multi-layer and multi-process information using XPS and XRF technologies
#18 | 2021-06-03 ✅ Patent 11,874,237 granted on 2024-01-16System and method for measuring a sample by x-ray reflectance scatterometry
#19 | 2021-01-28 ✅ Patent 11,346,795 granted on 2022-05-31XPS metrology for process control in selective deposition
#20 | 2020-06-18 ✅ Patent 11,668,663 granted on 2023-06-06Method and system for non-destructive metrology of thin layers
Also check out NOVA MEASURING INSTRUMENTS, INC.'s (Fremont, United States) applicant profile with 10 patent applications submitted.
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